Wafer edge measuring system WATOM T
opticalcompactprofilometer

Wafer edge measuring system - WATOM T - KoCoS Messtechnik AG - optical / compact / profilometer
Wafer edge measuring system - WATOM T - KoCoS Messtechnik AG - optical / compact / profilometer
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Characteristics

Technology
optical
Measured material
wafer edge
Other characteristics
compact, profilometer

Description

Single Wafer Edge Profiler WATOM T Small footprint and consistent accuracy WATOM T is a compact, inexpensive alternative for applications that have no automation requirements and provides the same quality, process reliability and measurement precision as other WATOM systems. WATOM T is designed to accept two wafer sizes for quick sample measurement. Equipped with a touch screen, this tool is easy to use for operators, experts and maintenance staff alike.

Catalogs

No catalogs are available for this product.

See all of KoCoS Messtechnik AG‘s catalogs

Exhibitions

Meet this supplier at the following exhibition(s):

ELECRAMA Indien
ELECRAMA Indien

20-24 Feb 2027 Greater Noida (India)

CONTROL Stuttgart 2026
CONTROL Stuttgart 2026

11-14 May 2027 Stuttgart (Germany)

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
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