Wafer edge measuring system WATOM T
opticalcompactprofilometer

Wafer edge measuring system - WATOM T - KoCoS Messtechnik AG - optical / compact / profilometer
Wafer edge measuring system - WATOM T - KoCoS Messtechnik AG - optical / compact / profilometer
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Characteristics

Technology
optical
Measured material
wafer edge
Other characteristics
compact, profilometer

Description

Single Wafer Edge Profiler WATOM T Small footprint and consistent accuracy WATOM T is a compact, inexpensive alternative for applications that have no automation requirements and provides the same quality, process reliability and measurement precision as other WATOM systems. WATOM T is designed to accept two wafer sizes for quick sample measurement. Equipped with a touch screen, this tool is easy to use for operators, experts and maintenance staff alike.

Catalogs

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Exhibitions

Meet this supplier at the following exhibition(s):

Cigre
Cigre

23-28 Aug 2026 Paris (France)

  • More information
    Middle East Energy
    Middle East Energy

    1-03 Sep 2026 Dubai (United Arab Emirates)

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.