Product OverviewThe Konica Minolta Spectrophotometer CM-3700A Plus sets a new standard in benchtop spectrophotometry with state-of-the-art technology that delivers precise and reliable color measurements. As the latest flagship model from Konica Minolta, it builds upon the legacy of its predecessor (CM-3700A) to provide improved repeatability, an inter-instrument agreement of ΔE*ab 0.08 or less, and enhanced measurement performance for opaque, transparent, translucent, and fluorescent samples. The instrument supports research & development, quality control, and computer color matching applications across industries such as consumer electronics, personal care and cosmetics, paints and coatings, plastics, building materials, textiles, food and beverage, and pharmaceuticals.
Key Capabilities- Simultaneous SCI (Specular Component Included) and SCE (Specular Component Excluded) measurement for improved productivity.
- Enhanced repeatability including very high precision for white and improved accuracy for black/dark colors.
- Camera viewfinder function for precise sample positioning and the ability to save images alongside measurement data.
- Ambient temperature/humidity sensor and a sample thermometer to record environmental conditions and sample surface temperature with measurements.
- Wavelength Analysis & Adjustment (WAA) function for internal performance check and wavelength shift correction during calibration.
- Spacious transmittance chamber and built-in accessory storage for practical usability.
Features (detailed)- High Inter-Instrument Agreement (IIA): ∆E*ab < 0.08 (average of 12 BCRA Series II color tiles; LAV/SCI).
- High repeatability: White within ∆E*ab 0.005; Black within ∆E*ab 0.02.
- Simultaneous SCI and SCE measurement capability.
- Multiple measuring areas: SAV, MAV, LMAV, LAV and transmittance mode.
- Camera viewfinder function (image capture/view using optional software such as SpectraMagic NX2).
- Ambient temperature sensor and sample thermometer (sample temperature measurement applicable for reflectance measurement).
- Built-in accessory storage compartment.
- Wavelength Analysis & Adjustment (WAA) function to diagnose and correct wavelength shifts.
Specifications (table)Illumination/viewing system | Reflectance: di:8°, de:8° (diffuse illumination/8° viewing angle); SCI/SCE switchable & simultaneous; Conforms to CIE No.15(2004), ISO 7724/1, ASTM E 1164, DIN 5033 Teil 7 and JIS Z 8722 condition c standard.
Illumination/viewing system | Transmittance: di:0°, de:0° (diffuse illumination/0° viewing angle); Conforms to CIE No.15(2004), ASTM E 1164, DIN 5033 Teil 7 and JIS Z 8722 condition g standard.
Integrating sphere size | Ø152 mm / 6 inches
Detector | 38-element silicon photodiode array
Spectral separation device | Diffraction grating
Wavelength range | 360 to 740 nm
Wavelength pitch | 10 nm
Half bandwidth | Approx. 14 nm average
Measuring range | 0 to 200%; Resolution: 0.001%
Light source | Pulsed xenon arc lamp
Measurement/illumination area | Reflectance: Changeable between SAV, MAV, LMAV and LAV. SAV: 3×5 mm measurement / 5×7 mm illumination. MAV: ø8 mm measurement / ø11 mm illumination. LMAV: ø16 mm measurement / ø20 mm illumination. LAV: ø25.4 mm measurement / ø28 mm illumination.
Measurement/illumination area | Transmittance: Approx. Ø20 mm / ø25 mm
Repeatability | White: Colorimetric values standard deviation within ΔE ab 0.005; Spectral reflectance standard deviation within 0.05% (30 measurements at 10 s intervals after white calibration). Black: Colorimetric values standard deviation within ΔE ab 0.02; Spectral reflectance standard deviation within 0.02% (30 measurements at 10 s intervals after white calibration on a BCRA Series II black tile, 1% reflectance).
Inter-instrument agreement | Within ΔE*ab 0.08 (average for 12 BCRA Series II color tiles; LAV/SCI compared to master body under Konica Minolta standard measurement conditions).
UV adjustment | UV cutoff filter: 400 nm; computer controlled continuously variable 0.0%~100.0% (1000 steps).
Sample temperature measurement | Accuracy within operating temperature/humidity range: SAV: ±1.2°C; LMAV, MAV: ±0.8°C; LAV: ±0.5°C.
Measurement time | SCI or SCE: Approx. 2 s; SCI or SCE with sample temperature: Approx. 4.5 s; SCI+SCE: Approx. 5 s; SCI+SCE with sample temperature: Approx. 5 s; Transmittance: Approx. 2 s.
Minimum interval between measurements | SCI or SCE: Approx. 3 s; SCI or SCE with sample temperature: Approx. 5 s; SCI+SCE: Approx. 6 s; SCI+SCE with sample temperature: Approx. 6 s; Transmittance: Approx. 3 s.
Transmittance chamber | Maximum sample thickness: Approx. 50 mm; Maximum sample length: Unlimited when chamber cover is open; optional sample holders for sheets or liquid containers available.
Camera viewfinder function | Uses internal camera; image viewable/copiable using optional software such as SpectraMagic NX2.
Internal Performance Check | WAA (Wavelength Analysis & Adjustment) Technology.
Ambient temperature sensor | Yes.
Interface | USB 2.0.
Power | Dedicated AC adapter.
Size (HxWxD) | Approx. 307(H) x 271(W) x 600(D) mm.
Weight | Approx. 20.0 kg.
Operating temperature/humidity range | Temperature: 13 to 33°C; Relative humidity: 80% or less (at 33°C) with no condensation.
Storage temperature/humidity range | Temperature: 0 to 40°C; Relative humidity: 80% or less (at 35°C) with no condensation.
Standard Accessories | White Calibration Plate; Target Masks (SAV, MAV, LMAV, LAV); Zero Calibration Box; USB Cable (3 m); AC Adapter.
Optional Accessories | Color Data Software SpectraMagic NX2; Transmittance Specimen Holder; Cells (glass 2 mm, 10 mm, 20 mm); Plastic cells (2 mm, 10 mm, 20 mm); Transmittance Zero Calibration Plate; Color Plates; Green tile; Dust Cover.
NotesWAA function: available free of charge for the first year after purchase; continued availability beyond first year requires instrument service/calibration. Specifications subject to change without notice.
Caractéristiques / spécifications techniques- Model: CM-3700A Plus
- Measurement modes: Reflectance (di:8°, de:8°) and Transmittance (di:0°, de:0°); SCI and SCE switchable and simultaneous
- Wavelength range: 360–740 nm; pitch 10 nm; half bandwidth ≈14 nm
- Detector: 38-element silicon photodiode array; spectral separation: diffraction grating
- Integrating sphere: Ø152 mm / 6 inches
- Measuring areas: SAV (3×5 mm), MAV (ø8 mm), LMAV (ø16 mm), LAV (ø25.4 mm); Transmittance approx. Ø20/ø25 mm
- Repeatability: White ΔE*ab within 0.005; Black ΔE*ab within 0.02
- Inter-instrument agreement: within ΔE*ab 0.08 (12 BCRA tiles, LAV/SCI)
- Light source: Pulsed xenon arc lamp
- Interface: USB 2.0; Power: Dedicated AC adapter
- Dimensions: Approx. 307 x 271 x 600 mm; Weight: Approx. 20.0 kg
- Environment: Operating 13–33°C, RH ≤80% (at 33°C) no condensation