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Thickness measurement interferometer interferoMETER 5200-THopticalwhite lighthigh-accuracy
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Characteristics
- Applications
- for thickness measurement
- Options
- optical, high-accuracy, white light
Description
White light interferometer for reliable thickness measurement with submicron accuracy
The new IMS5200-TH white light interferometer opens up new possibilities for fast and reliable thickness measurements. The controller features intelligent evaluation and enables precise thickness measurement of transparent layers as thin as 1 µm. Their high measuring rate up to 24 kHz makes the IMS5200 models ideal for industrial use. Nanometer accuracy for layers as thin as 1 µm.
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.