Thickness measurement interferometer interferoMETER 5400-TH
opticalwhite lighthigh-accuracy

Thickness measurement interferometer - interferoMETER 5400-TH - MICRO-EPSILON - optical / white light / high-accuracy
Thickness measurement interferometer - interferoMETER 5400-TH - MICRO-EPSILON - optical / white light / high-accuracy
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Characteristics

Applications
for thickness measurement
Options
optical, high-accuracy, white light

Description

White light interferometer for stable thickness measurement with submicron accuracy The new IMS5400-TH white light interferometer opens up new perspectives in industrial thickness measurement. The controller offers an intelligent evaluation feature and enables the thickness measurement of transparent objects with highest precision.

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Exhibitions

Meet this supplier at the following exhibition(s):

ELECTRONICA 2026
ELECTRONICA 2026

10-13 Nov 2026 Munich (Germany) Hall C1 - Stand 631

  • More information
    SPS 2026
    SPS 2026

    24-26 Nov 2026 Nuremberg (Germany) Hall 7A - Stand 130

  • More information
    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
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