Stylus profilometer CV-2100N4

contourfor profilesindustrial

Product overview
This contour measuring system supports fast, easy acquisition of complex profiles and is designed for efficient shop-floor and inspection-lab use. It enables both automated and manual measurements with high precision and flexible fixturing.

Key benefits

• Rapid and intuitive contour measurement of extensive profiles.
• Fast Z2 movement via an easy-to-use quick grip (M4 type).
• Automatic routines and multi-point measurement with the stylus up-and-down function.
• X-axis traverse speed up to 20 mm/s using the jog shuttle.
• Part programming and single measurements using FORMTRACEPAK software.
• Automatic evaluation including best-fit contour, CAD comparison and configurable inspection reports.
• CV-2100 M4 supplied with quick grip stand mounted on a granite base.
• CV-2100 N4 can be mounted on an optional granite base with a manual column.
• Centralized front control panel for operator convenience.

Technical specifications

• Model: CV-2100N4
• Inch-Metric: Metric
• Measuring range: Z1 = 50 mm; X = 100 mm
• Measuring speed: 0.02 - 5 mm/s
• Drive speed: X = 0 - 20 mm/s
• Accuracy: X = (2.5 + 0.02L) µm (L = drive length in mm); Z1 = (2.5 + 0.1H) µm (H = measurement height from horizontal position in mm)
• Z1-axis range: 50 mm
• Z2-axis column type: Optional: Manual
• X1-axis range: 100 mm
• Traverse straightness: 2.5 µm / 100 mm
• Column type (M4): 350 mm
• Software: FORMTRACEPAK - control of measuring conditions for efficient automated measurement; contour evaluation (level differences, angle, pitch, area, contour tolerancing); creation of inspection certificates with configurable print format.