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- Stylus profilometer
Stylus profilometers
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TIME®3234 is a portable stylus surface waviness tester, suitable for testing in workshop, laboratory, metrology center and etc.. It can measure roughness, waviness and primary profile. The test results can be displayed ...
High Resolution Surface Finish, Form, Contour Measurement Tool Housed in a rugged enclosure, the Intra has a proven history of maintaining accuracy of measurement without the need for constant maintenance or support. Quality, flexibility ...
TAYLOR HOBSON
... Suitable for form, surface roughness and contour measurements. •32 mm Stylus - Range / Resolution 32 mm / 125 nm (1.26 in / 4.8 μin) 6.4 mm / 25 nm (0.25 in / 1.0 μin) •20 mm Stylus - Range / ...
TAYLOR HOBSON
Optics Surface Finish & Form Measurement Equipment The Form Talysurf® PGI Optics contact stylus optical profilometer, measures surface finish & form of Optical components, from a large diameter lens ...
TAYLOR HOBSON
Form Talysurf i-Series PRO - Contour, Surface Finish Measurement Device The Form Talysurf® i-Series PRO is a range of high accuracy instruments capable of simultaneous surface finish and contour measurement.The system's low noise axes ...
TAYLOR HOBSON
Form Talysurf® WRi PRO - Contour and Form Measurement Instrument The Form Talysurf® WRi (Wide Range Inductive) instrument provides an in depth understanding of the measurement of contour and form. Taylor Hobson’s unique ball calibration ...
TAYLOR HOBSON
... macro buttons and analysis shortcuts. Superior gauging •Balanced beam giving any orientation measurement •Constant stylus force throughout its range •Integral lift / lower as standard •Small gauge diameter for ...
TAYLOR HOBSON
The Tencor P-7 benchtop stylus profiler builds on the success of the market leading Tencor P-17 benchtop stylus profiling system. It includes the superior measurement performance of the ...
KLA - TENCOR
... -and-click stage controls, top and side view optics and a high-resolution camera with optical zoom. The Tencor P-17 stylus profilometer supports 2D or 3D measurements, with a variety of filtering, leveling ...
KLA - TENCOR
The Tencor P-170 is a cassette-to-cassette profiler featuring the P-17’s industry leading benchtop system measurement performance and the HRP®-260’s production proven handler. This combination provides a low cost of ownership ...
KLA - TENCOR
The HRP®-260 is a high-resolution, cassette-to-cassette stylus profiler. The HRP offers production proven performance with automated wafer handling capability serving the semiconductor, compound semiconductor, high brightness ...
KLA - TENCOR
The Alpha-Step D-600 stylus profiler supports 2D and 3D surface measurements of step heights and roughness, plus 2D bow and stress. The stylus profiler’s innovative optical lever sensor ...
KLA - TENCOR
... distortion due to side view optics Arc Correction: Removes error due to arc motion of the stylus Compact Size: Smallest system footprint for a benchtop stylus profiler Software: ...
KLA - TENCOR
The Panasonic UA3P profilometer series is designed to measure aspherical lenses & molds, semiconductor wafers, and any other precision component requiring nanometer level accuracy ranging up to 200mm x 200mm. Different ...
... standard in stylus profiling DektakXT The DektakXT® stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4Å and up to 40% improvement ...
Bruker Handheld XRF Spectrometry
Gage-capable QA/QC profiler for optimal 300mm performance Dektak XTL The Dektak XTL™ stylus profilometer accommodates samples up to 350mm x 350mm, bringing legendary Dektak® repeatability ...
Bruker Handheld XRF Spectrometry
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