LED micrometer OptiMike™

opticalthicknessnon-contact

Overview
The OptiMike optical micrometer provides direct, single-sided, non-contact thickness measurement for non-metallic sheet and thick film products in on-line web processes. The optical technique is insensitive to colour, density, gloss or transparency. A LED array projects a beam across the product apex on a precision low run-out reference roll; a CCD micrometer array detects the beam interruption (top surface) with sub-micron resolution. An integrated eddy-current sensor measures sensor-to-roll distance and the system fuses both readings to compute absolute total thickness in real time for process control.

Key features

• Non-contact, single-sided thickness measurement suitable for on-line web applications
• Non-nuclear technology (no radioactive source)
• Unaffected by product colour, density, gloss or transparency
• Can be combined with weight sensors to derive material density
• Designed for simplified maintenance and integration into production lines

Measurement technique
The sensor uses an LED array to project light across the product apex on a precision reference roll. A precision CCD micrometer array on the opposite side locates the shadow edge to determine the top-surface position with sub-micron accuracy. An integrated eddy-current sensor measures the distance to the roll surface; the system combines CCD and eddy-current data to output absolute thickness online for process control and QA.

Applications

• Film and sheet extrusion
• Foam sheet production
• Rubber and plastic converting
• Calendered sheet and coated webs
• Nonwovens and technical textiles
• Hook-and-loop fastener materials
• Composites and laminates
• Tobacco web control

Technical specifications

• Measurement method: Optical (LED array + CCD micrometer) combined with eddy-current reference
• Measurement type: Direct, single-sided, on-line thickness measurement for web processes
• Suitable materials: Non-metallic sheets, films, foams, nonwovens, composites
• Resolution: Sub-micron top-surface detection (CCD-based)
• Reference element: Precision low run-out reference roll
• Integration: Compatible with weight sensors and process control systems
• Gauge type: Non-contact, non-nuclear optical micrometer