Infrared camera Xi 1M ETH

analogdigitalfor process monitoring

The Optris Xi 1M is a short-wavelength infrared camera that offers innovation, affordability, and precision in non-contact thermal imaging of challenging objects. Designed to operate within the short-wavelength infrared range (1M: 0.85 – 1.1 μm), this forward-looking infrared camera is engineered to capture measurement data for precise surface temperature analysis of hot steel, iron, brass, copper, tin, carbon, ceramics, and semiconductors. Addressing the rigorous demands of various industries, the Optris Xi 1M offers wide elevated temperature measurement ranges, exceptional accuracy, and customizable field-of-view configurations. Many measurement objects consisting of non-shiny material show high and relatively constant emissivity independent of their surface consistency, at least in long-wave spectral ranges. Nevertheless, many metallic and shiny materials have a low emissivity at long infrared wavelengths. Low emissivity of those materials in the long wavelength infrared bandwidth results in varying and unreliable measuring results. The spectral range of a short wavelength Xi 1M infrared camera matches most metallic material’s highest emissivity, which eases remote temperature measurement. In addition, due to Planck’s radiation law, exponentially more infrared radiation is emitted in the short wavelength range, so linear emissivity issues have less influence on the repeatability of temperature measurement results at short-wavelength. Therefore, contactless temperature measurement of shiny materials at high temperatures should always be as short-wave as possible, considering the higher temperature measuring range.