Confocal line sensor CHRocodile CLS 2

industrialfor bore-hole inspectionhigh-resolution

The CHRocodile CLS 2.0 enables you to measure complex surfaces with high slopes at very high speed and without shadowing. The high-speed confocal line sensor measures with utmost precision and high resolution on almost all materials, even difficult ones. Its versatility enables a wide variety of measuring tasks. What's more, the CHRocodile CLS 2.0 helps to reduce operational costs, saves time, and ensures 100% control in industry 4.0 applications. Last but not least, the high-speed confocal line sensor CHRocodile CLS 2.0 is much smaller and lighter than alternative devices. Applications for CHRocodile CLS 2.0 in the area of semiconductors: Wire bonding inspection, bump measurements, packaging wafer edge inspection, dicing groove inspection, defects, die cracks and photomask lithography. More applications for Consumer electronics: Housing topography inspection, inspection of slightly, medium and highly curved surfaces, chamfer and spline inspection, diameter/hole/stepped surface inspection, cosmetic inspection with additional height data. Advantages • High speed, utmost precision With its 48 million measuring points and a scanning speed of up to 40,000 lines per second, the CHRocodile CLS 2.0 is ideally suited to inline quality control applications where cycle time is critical. Besides, it delivers data with an extremely high lateral and axial resolution for ultra-precise measurements. • Great flexibility This confocal line sensor's versatility solves a wide variety of measuring tasks, e.g. topography and thickness measurements, compositions, layers, surfaces under transparent materials, and complex geometries.