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Infrared interferometry sensor CHRocodile IT 500/1000
for thickness measurementnon-contact

infrared interferometry sensor
infrared interferometry sensor
infrared interferometry sensor
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Characteristics

Type
infrared
Applications
for thickness measurement
Other characteristics
non-contact
Measuring distance

Max.: 3,000 µm

Min.: 10 µm

Description

The CHRocodile IT optical sensor family work with infrared light and is perfectly suitable for easy gauge measuring of visually non-transparent materials on one side as well. The various versions guarantees the optimum matching solution for numerous applications. Wafers in all stages of production can be measured precisely offline and inline within a gauge range of 10 µm - 3000 µm. Additional application areas are the gauge measurement of visual opaque as well as transparent plastic products. larger layer gauge measuring area polished and rough surfaces visual transparent and non-transparent materials measuring on one side inline and Offline high lateral resolution distance measurement (optional) simple integration damage-free measurement solid automatic light control large measuring distance range of tolerance

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