Measurement touch probe RSP3
3DscanningCMM

Measurement touch probe - RSP3 - RENISHAW - 3D / scanning / CMM
Measurement touch probe - RSP3 - RENISHAW - 3D / scanning / CMM
Measurement touch probe - RSP3 - RENISHAW - 3D / scanning / CMM - image - 2
Measurement touch probe - RSP3 - RENISHAW - 3D / scanning / CMM - image - 3
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Characteristics

Type
measurement, 3D
Technology
scanning
Applications
CMM
Other characteristics
touch-trigger
Measuring range

0.5 mm
(0.0197 in)

Description

The RSP3 range of probes gives REVO-2 the ability to carry cranked stylus arrangements while maintaining optimum metrology performance. The probes can be used for both 3-D scanning (X, Y, Z) and touch-trigger applications. They enable accurate scanning measurement with effective stylus lengths ranging from 20 mm to 394 mm. The RSP3 range is used for 3-axis scanning with fixed REVO-2 head angles during measurement. Each probe is designed to provide optimised accuracy and contact force over a specified stylus range. Consequently, the RSH3 stylus holders are intended for use only with their respective RSP3 probe. Key benefits: • Workpiece access: REVO’s infinite positioning and crank stylus carrying capabilities provide better part access. Each RSP3 probe has been optimised for maximum performance over its specific stylus range and crank carrying capabilities. • High accuracy 3-D scanning: RSP3 probes can be used with both straight and cranked styli for high accuracy 3-D scanning. • Part of the REVO 5-axis multi-sensor system: RSP3 probes are automatically interchangeable with all other probes available for REVO-2, including surface finish analysis and non-contact inspection probes. As a result, the system provides the optimum tool to measure multiple features all on one CMM platform.

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.