Thermal cycling tester SM-TTS-D

temperaturesensorfor electronic parts

SANWOOD Benchtop Thermal Cycling Test System SM-TTS-D

The SANWOOD SM-TTS-D brings rapid, component-level thermal cycling to the lab bench. Its benchtop design lets engineers position the system alongside sample fixtures and electrical measurement equipment. Two thermal test heads direct temperature-controlled air onto two devices, allowing both samples to be tested at the same time.

Technical Specifications

Model — SM-TTS-D

Form factor — Benchtop

Test configuration — Two thermal heads for simultaneous testing of two devices

Temperature control range — −80°C to +225°C

Typical air temperature transition time — Approx. 10 seconds in each direction between −55°C and +125°C

System airflow output — 4–18 scfm (1.89–8.50 L/s)

Temperature control modes — Air Mode and Device Under Test (DUT) Mode

Applications

Designed for thermal characterization, reliability testing and failure analysis of packaged ICs, sensors, optical modules and automotive electronic components.

For a configuration proposal, share your sample dimensions, fixture layout and target temperature profile.

Email — info@sanwood.com