Optical profiler S wide

3Dfor large partsindustrial

The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition. Large Area 3D Optical Metrology System - Advanced manufacturing - Archaeology & Paleontology - Consumer electronics - Medical devices - Molding - Optics - Watch industry Sub-micron height repeatability over entire extended area One shot height measurement up to 40 mm without Z scanning Bi-telecentric lenses with very low field distortion providing accurate metrology Form deviation from 3D CAD models providing the geometric difference and tolerance measurement