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Optical profiler S wide
3Dfor industrial applicationsfor large parts

optical profiler
optical profiler
optical profiler
optical profiler
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Characteristics

Technology
optical, 3D
Applications
for industrial applications, for large parts
Configuration
benchtop
Other characteristics
high-speed

Description

The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition. Large Area 3D Optical Metrology System - Advanced manufacturing - Archaeology & Paleontology - Consumer electronics - Medical devices - Molding - Optics - Watch industry Sub-micron height repeatability over entire extended area One shot height measurement up to 40 mm without Z scanning Bi-telecentric lenses with very low field distortion providing accurate metrology Form deviation from 3D CAD models providing the geometric difference and tolerance measurement

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Catalogs

S wide
S wide
4 Pages
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.