EDXRF spectrometer EDX-8100
energy dispersive X-ray fluorescenceXRFfor the semiconductor industry

EDXRF spectrometer - EDX-8100 - Shimadzu France - energy dispersive X-ray fluorescence / XRF / for the semiconductor industry
EDXRF spectrometer - EDX-8100 - Shimadzu France - energy dispersive X-ray fluorescence / XRF / for the semiconductor industry
EDXRF spectrometer - EDX-8100 - Shimadzu France - energy dispersive X-ray fluorescence / XRF / for the semiconductor industry - image - 2
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Characteristics

Type
EDXRF, energy dispersive X-ray fluorescence, XRF
Domain
for the semiconductor industry, for elemental analysis, for photovoltaic installations, for the electronics industry
Configuration
benchtop
Detector type
SDD
Other characteristics
high-sensitivity, high-resolution
Length

46 cm
(18.11 in)

Width

59 cm
(23.23 in)

Height

36 cm
(14.17 in)

Description

Overview
The EDX-8100 is an energy dispersive X-ray fluorescence (EDXRF) spectrometer for routine and advanced elemental analysis of solids, powders, liquids and thin films. It combines a compact footprint with a large sample chamber and supports helium purge and vacuum measurement modes for enhanced detection of light elements in liquids.

Features
  • Applications
    • Electrical and electronic materials analysis, RoHS and halogen screening
    • Thin-film analysis for semiconductors, discs, liquid crystals and solar cells
  • Functional design
    • Large sample chamber while minimizing installed width (approx. 20% smaller than previous model)
  • PCEDX Navi software
    • Graphical interface with simplified workflows for new users and advanced options for experienced analysts
  • Analytical capabilities
    • Silicon Drift Detector (SDD) and optimized hardware for high sensitivity, fast analysis and improved energy resolution
    • Support for light element detection, including enhanced sensitivity for liquids using helium purge
  • Sample flexibility
    • Accepts small to large samples, powders, liquids and thin films
    • Optional vacuum measurement unit and helium purge unit
  • Quantitation functions
    • Calibration curve method and comprehensive quantitation tools for routine and specialized analyses

Videos (examples)
  • EDX-7000/8000 Series — demonstration of instrument capabilities and typical applications
  • Analysis of natural vs imitation precious stones — example of light element analysis using EDX-8000/8100

Specifications
  • Instrument type: Energy Dispersive X-ray Fluorescence Spectrometer (bench-top)
  • Model: EDX-8100
  • Detector: Silicon Drift Detector (SDD)
  • X-ray source: Rh tube; voltage range typically 4 kV – 50 kV
  • Cooling: air-cooled (no liquid nitrogen required)
  • Measurement range: light elements up to uranium (model-dependent)
  • Options: helium purge unit, vacuum measurement unit, RoHS screening kit, automated sample changer
  • Sample handling: large sample chamber; supports powders, liquids, thin films and solid samples of various sizes
  • Software: PCEDX Navi for simplified operation and advanced analysis functions
  • Quantitation: calibration curve method, fundamental parameter options and other quantitation functions
  • Dimensions (approx.): 46 cm x 59 cm x 36 cm; Weight (approx.): 45 kg

Catalogs

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