EDXRF spectrometer EDX-7200

XRFEDXfor the pharmaceutical industry

Overview
The EDX-7200 is a model of the EDX series designed for high sensitivity, high speed and high accuracy. It supports regulatory compliance screening (RoHS/ELV, REACH, TSCA) through dedicated analysis kits and is equipped with a high-resolution SDD detector to increase count rate and detection efficiency.

Principle
When a sample is irradiated with X-rays from an X-ray tube, atoms in the sample emit characteristic fluorescent X-rays. Qualitative identification is performed by analyzing wavelengths/energies specific to each element, and quantitative analysis is achieved by measuring X-ray intensities proportional to element concentrations.

Main features

• High-resolution SDD detector providing increased count rates and improved detection efficiency.
• Superior energy resolution to reduce peak overlap and improve result reliability.
• Functional design accommodating samples up to approximately W300 × D275 × H100 mm.
• Support for compliance screening (RoHS/ELV, REACH, TSCA) via dedicated screening analysis kits.
• Optimized for high sensitivity, high speed and high analytical precision.

Applications

• Electrical/electronic materials
  • RoHS and halogen screening
  • Thin-film analysis for semiconductors, discs, liquid crystals and solar cells
• Automotive and machinery
  • ELV hazardous element screening
  • Composition analysis, plating thickness measurement and chemical conversion coating film weight measurement for parts
• Ferrous/non-ferrous metals
  • Main component and impurity analysis for raw materials, alloys, solder and precious metals
  • Slag composition analysis
• Mining
  • Grade analysis for ore processing
• Ceramics
  • Analysis of ceramics, cement, glass, bricks and clay
• Oil and petrochemicals
  • Sulfur analysis in oil
  • Analysis of additive and mixed elements in lubricating oils
• Chemicals
  • Analysis of products and organic/inorganic raw materials
  • Analysis of catalysts, pigments, paints, rubber and plastics
• Environment
  • Analysis of soil, effluent, combustion ash, filters and fine particulate matter
• Pharmaceuticals
  • Residual catalyst analysis during synthesis
  • Impurity and foreign-matter analysis in active pharmaceutical ingredients
• Agriculture and food
  • Analysis of soil, fertilizers and plants
  • Raw ingredient analysis, control of added elements and foreign-matter detection in foods
• Other
  • Composition analysis of archaeological samples and gemstones
  • Detection of toxic heavy elements in toys and consumer goods

Technical specifications

• Model: EDX-7200
• Detector: High-resolution SDD (Silicon Drift Detector)
• Detector benefits: High count rate, improved detection efficiency, reduced peak overlap
• Maximum sample size: Approx. W300 × D275 × H100 mm
• Design goals: High sensitivity, high speed, high precision
• Compliance support: Screening kits for RoHS/ELV, REACH, TSCA
• Analysis type: Qualitative (element ID) and quantitative (concentration from peak intensity)