High-temperature testing device

tensilebendingpressure

The heating device is heated by two sections of resistance radiation,it can realize 300-1000℃ experimental temperature, and have a good isotropical, temperature volatility and temperature gradient. In vacuum ,it can received GB. Use Level 0.1 AI Intelligent adjustment to control Intelligent temperature control table, have a small overshoot controlling parameter, also can control hcap of silcontrollable conduction angle,average heating speed 3℃/min-50℃/min. Customers have the option to install 1000℃ High-temperature Tensile Creep Test Fixture And Deformation Measuring Device, High temperature tensile creep test clamp of 1000℃ plate specimen and deformation measurement test drive, high temperature tension pressure creep fatigue test for 1000℃ round specimen, three-point bending test of 900 C: hightemperature clamp and deflection measuring device. Round test sample specification:φ5X25mm, φ6X25mm, φ8X25mm, φ10X25mm. Plate test sample specification: 2X6X25mm and 3X6X25mm. Deformation measurement can be measured in two ways, one is the double-sided measurement average of high temperature resistance difference transformer, range 0-10mm, resolution 1 µm, precision 0.5% (long creep use); the other is side plug extension, scale distance 25mm, range ± 5mm, resolution 1 µm, precision 0.5% (tensile or creep fatigue use).