Temperature testing machine HS-LDTS2000

qualityperformanceautomatic

HS-LDTS2000 is an LD chip optoelectronic performance tester engineered for production environments to evaluate long-wavelength laser chips under controlled room and high-temperature conditions. It integrates automated handling and intelligent imaging to support high-throughput quality control.

Main functions

• Automatic handling and testing workflow
• AOI appearance inspection and OCR character recognition for front and end faces
• High-throughput testing capability

Application areas

• Photonics
• Power devices
• Microwave RF devices
• New energy vehicle sector

Advantages

• Self-developed temperature control bench with high-precision regulation suitable for room and high-temperature tests
• High-precision vision system with re-inspection support to ensure product stability
• Feedstock compatibility — supports 2" GEL-PAK and 6" wafer ring
• Rotary table with separate synchronized workstations to increase throughput

Characteristics / Technical specifications

• Testing capability: LIV parameters and spectral parameters of frontlight and backlight of long-wavelength laser chips under room and high-temperature conditions
• Test methods / process: LD chip photoelectric performance testing (photoelectric characteristics & spectral measurement)
• Product scope: LD chips
• Chip size range: Minimum 0.15 x 0.2 mm; Maximum 10.0 x 10.0 mm
• Equipment efficiency: Approximately 4.5–6 S/PCS (depending on specific test application)