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- Aging test system
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Aging test system LQ-BI114laboratorycompactautomatic
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Characteristics
- Test type
- aging
- Domain
- laboratory
- Configuration
- compact
- Other characteristics
- automatic
Description
LQ-BI114 is an equipment specially developed for aging test of COC devices.
The main body of the equipment adopts a frame structure, and the carrier adopts a separable “drawer” form, and each drawer can control the temperature independently.
The carrier adopts standard quick-plug electrical interface, which can be designed according to different products and different carriers can be tested in the same test platform.
Technical Parameter
EML COC&DFB COC
LD Chip Type
ACC LIV
Test Functions
Can be set according to specific process
Aging Test Time
Other Suzhou Lieqi Intelligent Equipment Co., Ltd. products
Chip Burn-in & Packaging Testing Equipment
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.