- Metrology - Laboratory
- Metrology and Test Equipment
- Critical dimension measuring system
- TZTEK Technology Co.,ltd
Critical dimension measuring system MT2010VIS/IRinfraredcamera-basedfor semiconductors
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Characteristics
- Measured physical value
- critical dimension
- Technology
- camera-based, infrared
- Measured material
- for semiconductors
- Other characteristics
- automatic
Description
TZTEK’s infrared system in a leading position globally. The system combines high performance infrared camera with design-optimized infrared optics for generating images with excellent resolution and contrast.Effective measurement of features on the top, bottom and inside of substrate.
main features
•Automatic measurement
•Combination of visible and infrared light in reflected and transmitted modes
•SECS/GEM
•Low maintenance cost, stable and reliable
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.