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... spectral confocal measurement system is used to detect the size and flatness of semiconductor raw and epitaxial wafers. Product advantages: Wide application range Used for 4-8 inch original wafer, ...
... Lithography overlay control PWG5™ with XT Option Additional technologies extend the wafer handling and measurement capabilities of the PWG5 patterned wafer geometry system to support ...
KLA Corporation
... Product overview
Nikon's NEXIV VMZ-S series video
measuring
systems provide precise dimensional and height inspection for industrial micro‑measurement tasks. The series includes three
measuring ...
Nikon Metrology
... positioning in the coordinate system, no costly attachment of transducers. Thus, RoboVib enables a significant acceleration of productivity and time to market. Contact us for any vibration, acoustics and dynacmis measurement, for ...
VX1100 is suitable for precise dimensional measurement in the fields of machinery, electronics, molds, injection molding, hardware, rubber, low-voltage electrical appliances, magnetic materials, precision stamping, connectors, connectors, terminals, mobile ...
Chotest Technology Inc.
... Microscopic measuring machine MX3200 achieves wide-range measurement of tiny features by combining microscopic imaging with traditional video measurement. Equipped with a motorized turret, it can measure various microscopic ...
Chotest Technology Inc.
... Unpatterned Wafer 3D Inspection System WD4000 series can automatically measure wafer thickness, surface roughness, and micro-nano 3D microtopography at a time. Use white light confocal probes to measure ...
Chotest Technology Inc.
... Automated Wafer Edge Profiler WATOM 200/300mm Wafer Edge Measurement - pinpoint precise The use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials ...
... Automated Wafer Edge Profiler WATOM 150/200mm Wafer Edge Measurement – Reliable Projection Technology WATOM CCD uses profile projection technology as an alternative to the LS technology and provides ...
... Single Wafer Edge Profiler WATOM T Small footprint and consistent accuracy WATOM T is a compact, inexpensive alternative for applications that have no automation requirements and provides the same quality, process ...
... magnetic properties of wafer stacks are quickly and globally detected. Non-contact measurement avoids damage to the wafer by traditional magnetic characterization, and can be applied to sample detection before and after ...
... 3DGipsumB. The system for gypsum boards dimensional measurement Turn-key solution on the base of 2D laser scanners and point triangulation sensors for continuous contactless measurement of gypsum boards geometrical parameters. Measured ...
... The device is designed for non-contact scanning and measuring the inner diameter of pipes. Measured parameters: inner diameter, ovality, roundness. Handheld Inner Diameter Measuring Gauge RF096-18/30-155/307-НН D ...
... by noise or deformation. TZTEK’s metrology system provides the function to eliminate such interference. For structure width which is less than 0.7 μm, UV light can be applied. Film Thickness The system is designed ...
TZTEK Technology Co.,ltd
... G Series Auto Video Measuring System Automatic batch measurement, free your hands G series is ideal for a wide variety of industrial inspection applications requiring both vision and tactile measuring. Features ✦High ...
Guangdong Jinuosh Technology Co.,Ltd
... Small-sized measuring table combined with a high-resolution zoom optics The measuring workstation MT-100-Z70 combines the high resolution optical system and the efficient camera technology ...
... other 3D measurement ■ Optional THK linear guide and ball screw ■ Optional KEYENCE laser displacement sensor for roughness, flatness surface measurement ■ Optional spectral confocal sensor for measuring ...
Leader Precision Instrument Co. Ltd
... The new Cascade SUMMIT200 advanced 200mm probe system, is essential for collecting high accuracy measurement data on single or volume wafers; as fast as possible. Designed for R&D, device characterization/modelling ...
FORMFACTOR
... bar after orientation measurement, and can accurately measure out angle value of partial wafer. Structure: YX-6D silicon single crystal orientation instrument consists of X-ray controller, angular device, recorder, ...
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