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- Wafer measuring system
Wafer measuring systems
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![contour measuring system](https://img.directindustry.com/images_di/photo-m2/224338-19657609.jpg)
VX1100 is suitable for precise dimensional measurement in the fields of machinery, electronics, molds, injection molding, hardware, rubber, low-voltage electrical appliances, magnetic materials, precision stamping, connectors, connectors, ...
![distance measuring machine](https://img.directindustry.com/images_di/photo-m2/224338-19673054.jpg)
Microscopic measuring machine MX3200 achieves wide-range measurement of tiny features by combining microscopic imaging with traditional video measurement. Equipped with a motorized turret, it can measure ...
![vibration measuring system](https://img.directindustry.com/images_di/photo-m2/63468-17393477.jpg)
... positioning in the coordinate system, no costly attachment of transducers. Thus, RoboVib enables a significant acceleration of productivity and time to market. Contact us for any vibration, acoustics and dynacmis ...
![video measuring system](https://img.directindustry.com/images_di/photo-m2/242435-19638300.jpg)
... distance : 82mm • Software : JINUOSH A-VM SYSTEM software • Linear scale resolution : 0.1μm(Renishaw) • Driving system : • CNC control, close-loop AC Servo driving system, joystick, ...
Guangdong Jinuosh Technology Co.,Ltd
![instant imaging measuring machine](https://img.directindustry.com/images_di/photo-m2/242435-19639606.jpg)
... adjustment required. Specification • FOV : 190×130mm • Camera : 20 million pixel CCD • Lens : Bilateral telecentric lens • Measuring Accuracy(μm) : ±5.0 • Repeatability(μm) : ±2.0 • Measuring ...
Guangdong Jinuosh Technology Co.,Ltd
![shape measuring machine](https://img.directindustry.com/images_di/photo-m2/242435-19639690.jpg)
Specification • XY Axis Moving Range : 430mmx330mm • Z Axis Moving Range : 200mm • Camera : 20MP Black and White FOV • Wide field of view measurement mode : 500 mm×400 mm • High-precision measurement mode : ...
Guangdong Jinuosh Technology Co.,Ltd
![thickness measuring system](https://img.directindustry.com/images_di/photo-m2/113449-18650088.jpg)
... Lithography overlay control PWG5™ with XT Option Additional technologies extend the wafer handling and measurement capabilities of the PWG5 patterned wafer geometry system ...
KLA Corporation
![video measuring system](https://img.directindustry.com/images_di/photo-m2/21023-18205179.jpg)
... capable of high-speed, high-resolution, 3D inspection. Ground-Breaking, Multi-Functional, Confocal Video Measuring System This measuring system incorporates confocal ...
Nikon Metrology
![critical dimension measuring system](https://img.directindustry.com/images_di/photo-m2/235311-18687439.jpg)
... by noise or deformation. TZTEK’s metrology system provides the function to eliminate such interference. For structure width which is less than 0.7 μm, UV light can be applied. Film Thickness The system ...
TZTEK Technology Co.,ltd
![wafer measurement system](https://img.directindustry.com/images_di/photo-m2/173140-19441713.jpg)
... automated wafer measuring. Special device for automated measuring and analysis of smallest structures, very thin coatings and multilayer systems on wafers ...
![wafer measuring system](https://img.directindustry.com/images_di/photo-m2/4569450-19192102.jpg)
... magnetic properties of wafer stacks are quickly and globally detected. Non-contact measurement avoids damage to the wafer by traditional magnetic characterization, and can be applied to sample detection ...
![coordinate measuring machine](https://img.directindustry.com/images_di/photo-m2/99497-16209470.jpg)
... other 3D measurement ■ Optional THK linear guide and ball screw ■ Optional KEYENCE laser displacement sensor for roughness, flatness surface measurement ■ Optional spectral confocal sensor for measuring ...
Leader Precision Instrument Co. Ltd
![thickness measuring system](https://img.directindustry.com/images_di/photo-m2/178182-17898835.jpg)
... Small-sized measuring table combined with a high-resolution zoom optics The measuring workstation MT-100-Z70 combines the high resolution optical system and the efficient camera ...
![wafer measurement system](https://img.directindustry.com/images_di/photo-m2/25076-17706138.jpg)
The new Cascade SUMMIT200 advanced 200mm probe system, is essential for collecting high accuracy measurement data on single or volume wafers; as fast as possible. Designed for R&D, device characterization/modelling ...
FORMFACTOR
![orientation measuring system](https://img.directindustry.com/images_di/photo-m2/195082-12293271.jpg)
... bar after orientation measurement, and can accurately measure out angle value of partial wafer. Structure: YX-6D silicon single crystal orientation instrument consists of X-ray controller, angular ...
![thickness measuring system](https://img.directindustry.com/images_di/photo-m2/33645-18378168.jpg)
... spectral confocal measurement system is used to detect the size and flatness of semiconductor raw and epitaxial wafers. Product advantages: Wide application range Used for 4-8 ...
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