Wafer measuring systems

3 companies | 12 products
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video measuring system
video measuring system
NEXIV VMZ-R3020

... optical zooming head Detection of 0.1 mm transparent layer 8-segment ring illumination with three incident angles High measuring accuracy Faster throughput 15x high-speed zoom Applications Surface analysis, Surface ...

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Nikon Metrology
angle measuring system
angle measuring system
NEXIV VMR-H3030

... precision of the NEXIV series, as well as advanced usability and performance. Key benefits 5 types of optical zooming systems 8-segment ring illuminator with three incident angles Easy to use, streamlined software Highest ...

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Nikon Metrology
video measuring system
video measuring system
NEXIV VMZ-K3040

... accurate with this system! The Confocal NEXIV can be optimally used for measurements of a variety of bump heights on advanced IC packages such as wafer-level CSP, as well as for the inspection of highly ...

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Nikon Metrology
video measurement system
video measurement system
NEXIV VMZ-R4540

The CNC Video Measuring System "NEXIV VMZ-R4540" is capable of accurately measuring the dimensions and shapes of high density and multi-layered electronic components. Key benefits Six ...

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Nikon Metrology
video measuring system
video measuring system
NEXIV VMZ-R6555

... optical zooming head Detection of 0.1 mm transparent layer 8-segment ring illumination with three incident angles High measuring accuracy Faster throughput 15x high-speed zoom Applications Surface analysis, Surface ...

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Nikon Metrology
thickness measuring system
thickness measuring system
NEXIV VMZ-K6555

... boards, MEMS and a variety of other demanding applications. Key benefits Simultaneous wide-area height measurement with Nikon proprietary confocal optics 2D measurement with 15x brightfield zoom optics Fully compatible ...

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Nikon Metrology
orientation measuring system
orientation measuring system
YX-6D/6DA

... deflection angle, X & Y value of crystal bar after orientation measurement, and can accurately measure out angle value of partial wafer. Structure: YX-6D silicon single crystal orientation instrument consists of X-ray ...

angle measuring system
angle measuring system

X-ray automatic orientation instrument is a kind of accurate device which deigned integrates light, mechanical, electrical into one body according to X-ray diffraction principle, it can fast measure crystal direction of natural and artificial ...

temperature measuring system
temperature measuring system
EtchTemp series

The EtchTemp Series of in situ wafer temperature measurement systems captures the effect of the plasma etch process environment on production wafers. The EtchTemp-SE ...

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KLA - TENCOR
temperature measurement system
temperature measurement system
HighTemp-400

In Situ Film Deposition Wafer Temperature Measurement System The HighTemp-400 in situ wafer temperature measurement system is designed ...

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KLA - TENCOR
light measurement system
light measurement system
UV Wafer

... Situ Deposition and Anneal UV Light Measurement System The UV Wafer in situ ultraviolet (UV) light measurement system utilizes wireless sensor wafer ...

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KLA - TENCOR
temperature measurement system
temperature measurement system
WetTemp-LP

... Processing Wafer Temperature Measurement System The WetTemp-LP in situ wafer temperature measurement system supports monitoring of ...

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KLA - TENCOR