Wafer measuring systems

10 companies | 42 products
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vibration measuring system
vibration measuring system
RoboVib

... positioning in the coordinate system, no costly attachment of transducers. Thus, RoboVib enables a significant acceleration of productivity and time to market. Contact us for any vibration, acoustics and dynacmis ...

wafer measuring system
wafer measuring system

... magnetic properties of wafer stacks are quickly and globally detected. Non-contact measurement avoids damage to the wafer by traditional magnetic characterization, and can be applied to sample detection ...

coordinate measuring machine
coordinate measuring machine
INSIGHT 800

... other 3D measurement ■ Optional THK linear guide and ball screw ■ Optional KEYENCE laser displacement sensor for roughness, flatness surface measurement ■ Optional spectral confocal sensor for measuring ...

optical measuring machine
optical measuring machine
APC series

... metrology software, the inspect device can achieve batch measurement with high efficiency. Features • X,Y and Z axis of CNC measuring instrument are controlled by Panasonic servo motor, with high positioning accuracy ...

thickness measuring system
thickness measuring system
PWG™

... Lithography overlay control PWG5™ with XT Option Additional technologies extend the wafer handling and measurement capabilities of the PWG5 patterned wafer geometry system ...

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KLA - TENCOR
video measuring system
video measuring system
NEXIV VMZ-K3040

... capable of high-speed, high-resolution, 3D inspection. Ground-Breaking, Multi-Functional, Confocal Video Measuring System This measuring system incorporates confocal ...

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Nikon Metrology
critical dimension measuring system
critical dimension measuring system
DaVinci

... by noise or deformation. TZTEK’s metrology system provides the function to eliminate such interference. For structure width which is less than 0.7 μm, UV light can be applied. Film Thickness The system ...

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TZTEK Technology Co.,ltd
thickness measuring system
thickness measuring system
MT-100 + Zoom70

... Small-sized measuring table combined with a high-resolution zoom optics The measuring workstation MT-100-Z70 combines the high resolution optical system and the efficient camera ...

wafer measurement system
wafer measurement system
SUMMIT200

The new Cascade SUMMIT200 advanced 200mm probe system, is essential for collecting high accuracy measurement data on single or volume wafers; as fast as possible. Designed for R&D, device characterization/modelling ...

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FORMFACTOR
orientation measuring system
orientation measuring system
YX-6D/6DA

... bar after orientation measurement, and can accurately measure out angle value of partial wafer. Structure: YX-6D silicon single crystal orientation instrument consists of X-ray controller, angular ...

thickness measuring system
thickness measuring system

... spectral confocal measurement system is used to detect the size and flatness of semiconductor raw and epitaxial wafers. Product advantages: Wide application range Used for 4-8 ...

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