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Resolution: 1 µm
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables ...
... on the latest LED technology and is fully integrated into the microscope. The low heat radiation and integration into the stand ensures that there is an optimal airflow around the microscope. The long ...
... on the latest LED technology and is fully integrated into the microscope. The low heat radiation and integration into the stand ensures that there is an optimal airflow around the microscope. The long ...
Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution ...
Surface morphology is an important property for many high-tech surfaces with features as small as a few nanometers and surface roughness below one nanometer. The Nanite is the tool of choice for surface analysis of workpieces of all shapes ...
Magnification: 50 unit
Weight: 45 kg
... processing software of the NIS-Elements suite, together with microscope data on the objective lens used, magnification setting and light intensity. Integration of L200N and Wafer Loader NWL200 Nikon ...
Nikon Metrology
Resolution: 5 µm
... feature resolution and 3 linear axes with precision ball bearing Triax – Low-noise measurements down to fA levels • Stereo microscope: 15x–100x magnification with large field-of-view and camera-ready c-mount • Four ...
FORMFACTOR
... 300 AUTO WAFER is a product line developed for in line production control of bonded wafers. Its is compatible with clean room class 10. The main application is detection of voids, inclusions and delaminated ...
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