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Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of ...
On-line measurement of particle size using Dynamic Light Scattering Malvern's Zetasizer AT brings the industry leading Dynamic Light Scattering (DLS) technology of the Zetasizer Nano to the process development and manufacturing arena, ...
More angles, more data, more choice! The Viscotek SEC-MALS 20 is a multi angle light scattering detector that can be used to measure the absolute molecular weight of proteins, synthetic and natural polymers, as well as molecular size ...
The ElectroForce 5500 test instrument allows usage of customer-supplied saline baths or sterile testing fixtures/chambers for biomaterials testing and tissue engineering. Key Features General-purpose entry-level ...
PowderPro A1 Automatic Powder Characteristics Tester PowderPro A1 automatically analyze powder characteristics such as Angle of Repose, Angle of Fall, Angle of Spatula, Bulk Density, and Tapped Density of a variety of powder materials. ...
PowderPro M1 Manual Powder Characteristics Tester PowderPro M1 is a basic version of PowderPro A1. It can perform the same measurement and analysis of PowderPro A1 through manual process. PowderPro M1 is widely used in education field. ...
... light scattering instrument for absolute characterization of proteins, conjugates, macromolecules, and nanoparticles. The DAWN® HELEOS® II is the premier Multi-Angle static Light Scattering (MALS) detector ...
Wyatt Technology
... distribution as a function of aspect ratio hitting a surface inside a plasma reactor. This unique plasma characterisation instrument can also measure the ion energy, ion flux and bias voltage. The angle of ions ...
Impedans Ltd
... Materials Testing The new TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer ...
Analyze the transmitted wavefront of optical systems with medium resolution • Perform precision characterization of optical surfaces • Increase the N/A for direct wavefront measurement The implemented Wavefront ...
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