Dielectric characterization instrument

Overview

The Dielectric Measurement System is a temperature‑controlled impedance/ dielectric analyzer platform for electrical characterization of insulating and functional materials across a wide temperature and frequency range. It supports continuous, high‑speed measurements and can be expanded for additional tests such as breakdown and TSDC.

Measurement parameters

• Temperature range: -185°C to 600°C
• Temperature control accuracy: ±0.25°C
• Temperature ramp rate: up to 10°C/min (configurable)
• Sample size: φ < 25 mm; thickness < 4 mm
• Electrode material: Platinum
• Clamp auxiliary material: Aluminum nitride ceramic
• Test frequency: 20 Hz – 10 MHz (system capability up to 30 MHz depending on configuration)
• Low temperature refrigeration: Liquid nitrogen
• Heating method: DC electrode heating
• Cooling method: Water cooling
• Data transmission: RS-232
• Input voltage: 110–220 V
• Equipment size: 180 mm × 210 mm × 50 mm

Features

• DC electrode heating and filtering to remove mains harmonic interference and enhance measurement stability.
• Three‑electrode measurement method and impedance‑matched leads to reduce errors from lead impedance and high‑temperature shielding limits.
• Optimized sample temperature sensing and electrode design (e.g., sputtered conductive coatings) to minimize stray capacitance and spatial effects.
• Expandable architecture for additional functions such as breakdown testing and Thermally Stimulated Depolarization Current (TSDC).

Operational software

• LabVIEW‑based software: stable, supports saving data across power loss and saving image data; compatible with Windows XP, 7 and 10.
• Multilingual interface: Chinese and English supported.
• Real‑time test monitoring, status legends/icons, user permission management and equipment fault alarms.
• Customizable test reports with one‑click print and export to Excel and PDF; measurement curves and images can be saved.
• Compatible with impedance analyzers from Keysight (E4990, E4991, E4980A), Wayne Kerr (6500B, 6530, 4235), Tonghui (2983, 2838, 2851) and similar instruments.

Measured parameters & test functions

• Dielectric temperature spectrum and dielectric frequency spectrum measurements.
• Measured electrical quantities: ε' (real) and ε'' (imaginary) dielectric constant; C' and C'' capacitance real/imaginary parts; D loss; R' and R'' resistance; Z (Z', Z'') impedance; Y (Y', Y'') admittance; X reactance; Q quality factor; Cole‑Cole plot; electromechanical coupling coefficient Kp.
• Mode selection: parallel and series equivalent circuit measurement modes.
• Measurement frequency: configurable via software.
• Data and image export: measurement data, curves and images exportable and savable.

Technical specifications

• Temperature range: -185°C to 600°C
• Temperature control accuracy: ±0.25°C
• Temperature ramp rate: up to 10°C/min (settable)
• Sample size: φ < 25 mm; thickness < 4 mm
• Electrode material: Platinum
• Clamp auxiliary material: Aluminum nitride ceramic
• Heating method: DC electrode heating
• Low temperature refrigeration: Liquid nitrogen
• Cooling method: Water cooling
• Test frequency (typical): 20 Hz – 10 MHz; capability up to 30 MHz (configuration dependent)
• Data transmission: RS-232
• Input voltage: 110–220 V
• Equipment size: 180 mm × 210 mm × 50 mm