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... measurement of magnetic circuit gaps, surfaces and general open magnetic fields. Axial sensors are usually cylindrical and are mainly used for the measurement of the center hole of ring magnets, inside ...
... 300 kHz - 60 MHz H field Broadband MAIN APPLICATIONS Broadcasting: IEC 62577, EN 50475, EN 50476, EN 50496, EN 50554 RFID/EAS: EN 50364, EN 50357, IEC/EN 62369-1 Induction heating (HF): EN 50519 Medical: IEC 60601 Workplace assessment: ...
... 30 MHz - 1000 MHz H field Broadband MAIN APPLICATIONS Broadcasting: IEC 62577, EN 50475, EN 50476, EN 50496, EN 50554 RFID/EAS: EN 50364, EN 50357, IEC/EN 62369-1 Induction heating (HF): EN 50519 Medical: IEC 60601 Workplace assessment: ...
... DC - 40 kHz H Field Selective & Broadband APPLICATIONS Medical (MRI: Magnetic Resonance Imaging): IEC 60601-2-33 Railway (DC Motors): EN 50500 Automotive (Electrical vehicles) Chemical Industry (Electrolysis) Strong ...
... MFI magnetic field indicator – SAMFI Octagonal probe for checking the orientation of magnetic fields, quality of dry and wet magnetic powders and ...
... The G1-AM 10 is a magnetic settlement probe designed to accurately detect the position of magnetic rings along the settlement column. Equipped with a portable battery-powered control unit, it is ideal ...
... designed to test magnetic fields (H) and two high-frequency probes designed to test electric fields (E). The magnetic field probes feature ...
... Array of Magnetic Field Detection System GAS3000 can be applied in various magnetic field measurements, like all types of spatial variation of the magnetic field ...
... factors), eliminating the typical need for two probes. PI-H1 probe is very compact, rugged and offers good magnetic field overload capability and pick up suppression of the out-of-band ...
... This field evaluator probe can be used with a digital volt meter (DVM) or oscilloscope to measure AC magnetic field intensities and attenuation ratios. Each probe is ...
Magnetic Shield Corporation
... 000 Gs). Magnetic induction on the working surface of the probe is adjusted by changing the magnetic system position (moving closer /farther) in relation to the probe working surface. Incoming ...
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