Resistivity test system DXHCR1100

processfor semiconductorsfor fuel cells

Product Overview
Dexinmag instruments measure the thermoelectric interaction (Seebeck, Peltier, Thomson effects) by simultaneously acquiring Seebeck coefficient and resistivity from room temperature (RT) up to 1500°C. Thermopower (Seebeck coefficient) is given in V/K and varies with temperature. The DXHCR1100 platform supports controlled atmospheres and flexible sample geometries for R&D and quality control.

Application Areas

• Thermoelectric material development: measurement of Seebeck coefficient and electrical conductivity for semiconductors, skutterudites and other TE materials; ZT calculation and high‑temperature evaluation up to 1500°C or under controlled atmospheres (vacuum/reducing/oxidizing).
• Electronic and functional materials characterization: electrical transport studies on semiconductor thin films, conductive polymers and metal oxides; resistance‑temperature profiling of HT superconductors and ceramic composites.
• Energy materials and devices: resistivity and contact/interface analysis for Li‑ion battery electrodes and solid electrolytes; catalyst conductivity testing for fuel cells under varied atmospheres.
• Industrial QC and process optimization: thermo‑electrical testing of alloys, ceramics and carbon materials to guide sintering and coating processes; evaluation of high‑temperature and corrosion‑resistant materials.
• Academic and standard testing: platform suitable for universities, research institutes and certification tests per standards (e.g., ASTM E1225).

Testing Functions

• Integrated intelligent measurement software (Windows 10/11) for automated excitation, data acquisition, real‑time processing and result export.
• Template editing and minimal parameter input for repeatable measurement workflows.
• Real‑time acquisition and analysis, comparison of up to 32 measurement curves, curve subtraction and overlay.
• Advanced analysis tools: curve zoom, first/second derivative, multi‑peak analysis and support for complementary methods (DSC, TG, TMA, DIL).
• Multi‑point temperature calibration and enthalpy/heat flow Cp routines; ASCII import/export and MS Excel export.
• Sequenced signal control and long‑duration experiment support.

Product Advantages

• Wide temperature range and controlled atmospheres: RT to 800/1100/1500°C options; compatible with inert, oxidizing, reducing and vacuum environments.
• High precision and integrated measurement modes: Seebeck range 1–2500 μV/K (accuracy ±7%, repeatability ±3%); electrical conductivity 0.01–2×10⁵ S/cm (accuracy ±5–8%, reproducibility ±3%). Measurement methods: static DC for Seebeck, four‑probe for resistivity.
• Flexible sample handling: supports cylindrical (φ6 mm × 23 mm), prismatic (2–5 mm face width × 23 mm) and disk specimens (10 / 12.7 / 25.4 mm); adjustable probe spacing 4/6/8 mm and sandwich clamping fixture.
• Long‑term stability and high‑temperature operation: power supply 0–1 A with stable output; electrode options nickel (−100–500°C) or platinum (−100–1500°C); K/S/C thermocouples and closed‑loop temperature control.

Product Specifications

• Model: DXHCR1100
• Temperature range: RT to 800/1100/1500°C (configurable)
• Measurement principles: Seebeck — static DC; Resistivity — four‑probe
• Atmospheres: inert, oxidizing, reducing, vacuum
• Sample holder: sandwich clamp between two electrodes
• Supported sample dimensions: cylindrical φ6×23 mm; prismatic 2–5 mm width × 23 mm; disks 10 / 12.7 / 25.4 mm
• Adjustable probe distance: 4 / 6 / 8 mm
• Seebeck range: 1–2500 μV/K (accuracy ±7%, repeatability ±3%)
• Electrical conductivity range: 0.01–2×10⁵ S/cm (accuracy ±5–8%, reproducibility ±3%)
• Power supply: 0–1 A (stable output)
• Electrode material: Nickel (−100 to 500°C) / Platinum (−100 to +1500°C)
• Thermocouples: K / S / C types

Technical specifications

• Model: DXHCR1100
• Temperature options: RT–800/1100/1500°C
• Seebeck method: static DC
• Resistivity method: four‑probe
• Compatible atmospheres: inert, oxidizing, reducing, vacuum
• Probe spacing: 4 / 6 / 8 mm
• Sample types: cylinders, prisms, disks (dimensions above)