Ferroelectric test system DX-FE2000

laboratoryhigh-voltage

Overview
The DEXINMAG DX-FE2000 Ferroelectric Test System is an integrated measurement platform for ferroelectric, piezoelectric and dielectric characterization. It delivers multi-function testing and high-speed acquisition in a single host and supports external connection to high-voltage amplifiers for extended ranges.

Measuring functions:

• DHM – Dynamic Hysteresis Loop Measurement
• CVM – CV Measurement
• LM – Leakage Current Measurement
• FM – Fatigue Measurement
• PM – Pulse Measurement
• PYM – Pyroelectric Measurement
• DTS – Dielectric Thermometry Measurement
• RT – Resistance Measurement
• PZM – Piezoelectric Measurement
• CHM – Static Hysteresis Loop Measurement
• IM – Blot Measurement
• RM – Retention Measurement
• BDM – Breakdown Test
• TSDC – Thermally Stimulated Current Measurement
• ECM – Electric Card Test
• POM – Oil Bath Polarization

Instrument configuration:
The system integrates a dedicated industrial computer host with measurement electronics including test circuit, operational amplifier and data processing unit.

• Host: industrial motherboard, CPU i5 or higher, RAM ≥ 8 GB, SSD ≥ 250 GB, network card, USB, DVD drive, VGA output, Windows 7 and Dexinmag test software pre-installed.

Calibration and extension:

• Calibration module: built-in high-precision resistance and capacitance test modules for self-calibration and improved accuracy.
• Device expansion: compatible with hot/cold tables, high-temperature test equipment, probe stations, high-voltage amplifiers, high-resistance meters, impedance analyzers, laser interferometer temperature controllers, digital source meters, etc.

Expandable parts / Test fixtures:

• Block test fixture — for thick-film, bulk ferroelectric and breakdown testing.
• Thin film four-probe probe station — (room temperature to 200°C) for thick-film ferroelectric, piezoelectric (e31) and pyroelectric tests.
• Thin film wide temperature zone probe hot and cold stage — (−196°C to +600°C) for wide-range temperature ferroelectric and pyroelectric testing.
• Thin film probe station — room-temperature ferroelectric tests for thin and thick films.

High-voltage amplifier options (bulk materials):

• DXAM-10KV: ±10 kV; 0–20 mA; max 5 kHz.
• Trek 609E-6: ±4 kV; 0–20 mA; max 6 kHz.
• Trek 610E: ±10 kV; 0–2 mA; max 600 Hz.

Piezoelectric testing / laser interferometer option:

• SIOS laser interferometer single-channel optical probe — resolution min 0.3 nm; displacement range 100 nm – 2579.50 μm.

Interfaces:

• USB Host Port: Type A (mouse/keyboard/USB flash drives).
• USBTMC Interface: Type B (USBTMC/USB488/USB 2.0 TMC compatible, connectable to external PC).
• LAN: 10/100/1000 Base-T Ethernet.
• Video output: 15-pin mini D-Sub (VGA compatible).

Analyzer protection & notes:

• Breakdown protection: measurement circuit withstand voltage up to 25 kV. When using external TREK amplifiers, follow Dexinmag high-voltage protection module recommendations.

Analyzer environmental indicators:

• Working environment: Temperature +5°C to +40°C; Humidity (wet-bulb < +29°C) 20%–80% non-condensing; Altitude 0–2,000 m; Vibration ≤ 0.21 Grms (5–500 Hz).
• Non-working environment: Temperature −10°C to +60°C; Humidity (wet-bulb < +40°C) 20%–90% non-condensing; Altitude 0–4,572 m; Vibration ≤ 2.09 Grms (5–500 Hz).

Characteristics / Technical specifications:

• Brand: DEXINMAG (Dexinmag).
• Model: DX-FE2000.
• Built-in voltage: ±10 V (external high-voltage amplifiers supported).
• External HV expansion options: ±20 V, ±100 V, ±200 V, ±500 V, 4 kV, 10 kV, 20 kV (with appropriate protection modules).
• ADC resolution: 18 bits.
• Minimum charge resolution: < 10 fC.
• Minimum area resolution: < 1 μm² (as specified).
• Maximum reported charge ranges: 276 μC; 27.6 mC (range-dependent).
• Maximum reported area ranges: 2.76 cm²; >100 cm² (range-dependent).
• Maximum hysteresis-loop test frequency: examples reported up to 500 kHz across voltages.
• Minimum test frequency: 0.03 Hz.
• Minimum pulse width: 0.5 μs.
• Minimum pulse rise time (5 V): 400 ns.
• Maximum pulse width: 1 s.
• Maximum delay between pulses: 40 ks.
• Internal clock resolution: 25 ns.
• Minimum leakage current (max integration 20 s): < 1 pA.
• Input capacitance: approx. 60 fF.
• Impedance input: yes.