{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
... configurable Automatic Test Equipment (ATE) system for parallel testing of silicon, SiC and GaN power devices. Designed for wafer sort, strip test, pick & place and gravity handler environments, it supports ...
... Compatibility: IGBT/DIODE/ MOSFET/BJT/SCR test. UPS power supply system: ensure system and data security under power off condition. . Power cycling test . Thermal ...
Hefei Kewell Power System Co., Ltd.
... The MX700S static test system is composed of a high-voltage power supply unit, fixture unit, measurement unit, relay switching unit, pulsed current source and supporting test instruments. ...
Hefei Kewell Power System Co., Ltd.
... Multi-Site MOSFET Test System-STS8202 System Feature: - MOSFET Wafer Testing up to 16 sites，100v/10A per site test - High voltage test ...
Beijing Huafeng Test & Control Technology Co., Ltd.
... Power Discrete Test System-STS8203 System Features： - Focus on power discrete device test as MOSFET，Schottky, IGBT - 2000v/ 200A DC test capability - ...
Beijing Huafeng Test & Control Technology Co., Ltd.
... PMST Power Device Analyzer Static Test System For MOSFET BJT IGBT And SiC GaN Semiconductors The power device static parameter test system (PMST) integrates a variety ...
Wuhan Precise Instrument Co.,Ltd
... Semiconductor power device C-V characteristic testing system Capacitance-voltage (C-V) measurements are widely used to measure semiconductor parameters, especially MOS CAP and MOSFET structures. The capacitance of ...
Wuhan Precise Instrument Co.,Ltd
the best suppliers