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... configurable Automatic Test Equipment (ATE) system for parallel testing of silicon, SiC and GaN power devices. Designed for wafer sort, strip test, pick & place and gravity handler environments, it supports ...
... current detection, enabling characterization of modern devices including
IGBT, GaN and SiC.
Models
- PST6747Ai: high accuracy, aimed at research and development; test reports include detailed characteristic
... characteristics test system for power semiconductor. It consists of sampling unit, temperature control unit, power supply unit and system control unit. It is mainly suitable ...
Hefei Kewell Power System Co., Ltd.
... The MX700S static test system is composed of a high-voltage power supply unit, fixture unit, measurement unit, relay switching unit, pulsed current source and supporting test instruments. ...
Hefei Kewell Power System Co., Ltd.
... introduction
MX700KGD series chip dynamic/static screening
test
system is an automated solution for screening bare dies, primarily used for SiC MOS and
IGBT chips. The
system consists ...
Hefei Kewell Power System Co., Ltd.
... Power Discrete Test System-STS8203 System Features： - Focus on power discrete device test as MOSFET，Schottky, IGBT - 2000v/ 200A DC test capability - ...
... PMST Power Device Analyzer Static Test System For MOSFET BJT IGBT And SiC GaN Semiconductors The power device static parameter test system (PMST) integrates a variety ...
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