Semiconductor strain gauge N
surface

Semiconductor strain gauge - N - BCM SENSOR TECHNOLOGIES bv - surface
Semiconductor strain gauge - N - BCM SENSOR TECHNOLOGIES bv - surface
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Characteristics

Technology
semiconductor
Geometry
surface
Resistance

Max.: 1,000 Ohm

Min.: 15 Ohm

Gauge factor (k)

80 unit, 100 unit, 130 unit, 150 unit, 200 unit

Description

Based on piezoresistive effect, the semiconductor strain gauges (ScSG) from BCM SENSOR are made from p-type silicon wafers, and are manufactured in two series: N-series in which the ScSG is made without backing, and B-series the ScSG with backing. The two series of ScSG have three options available for their gauge length: 2.6mm, 3.8mm. and 5mm. In terms of leads/wires layout of ScSG, the B-series has two options, while the N-series has only one option as its leads are flexible and can be bent. The details are described at Layout of Leads or Wires on the page 1 of the datasheet. In case the difference of the ScSG resistance is particularly required to be smaller than the standard tolerance of BCM SENSOR, the ScSG will be specially sorted and packaged as the grouped gauges to guarantee the required limit. This is specified as the 6th and 7th codes in the ordering code. To ensure quick delivery, samples of both the N- and B-series of ScSG are available from stock of different gauge factor, gauge length and resistance. The ScSG is mostly used either to measure small strain (in a few of microstrain, μɛ) or to compensate nonlinearity in transducer applications.

Catalogs

119B
119B
3 Pages
Model 330B
Model 330B
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Model 301B
Model 301B
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.