Power transformer test system TH2840BX

Features ■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file ■ 10.1 inch 1280×800 capacitive touch screen ■ Graphical pin association setting page, so that wiring is no longer a problem ■ Lk setting does not need to input the leakage inductance pin, which is more intuitive ■ Enhanced balance scanning function, from 5 points to 10 points ■ Range switching adopts electronic switch, fast speed, long life, no noise ■ Optional LCR function ■ Approximately 100M setting file storage space in the machine, and massive U disk setting file storage capacity ■ Provide host computer to support early model file format conversion to ensure compatibility Applications ■ Switching transformer scanning test, comprehensive characteristics analysis. ■ Network transformer scanning test, comprehensive characteristics analysis ■ Discrete passive components (L, R, C) multi-channel scanning test ■ Relay drive line package, contact resistance multi-channel scanning test ■ Multi-channel DC resistance DCR scanning test ■ Comprehensive test analysis of multiple passive components in impedance network