The Hybrid 3D optical profilometer Superview WT series is usedd for sub nanometer measurement of
surfaces of various precision components and materials. It integgrates the performance characteristics
of two high-precision 3D measuring instruments, white light interferometer and confocal microscope,
and can perform non-contact scanning of the samples surface tthen re-establish 3D surface image.
When measuring the ultra smooth and transparent surfaces, whhite light interferometry mode can be
used to obtain high-precision and distortion-free images, and analyzeparameters such as roughness.
When measuring coarse surfaces with sharp angle featuires, confocal microscopy mode can recon
struct large angle 3D topography images, and 2D & 3D parameters reflecting surface quality are
obtained by data processing and analysis of surface 3Dimages through software.