Automatic test equipment VIP Ultra
automatedsemiconductorfor the electronics industry

Automatic test equipment - VIP Ultra - Cosmic Equipment S.p.A. - automated / semiconductor / for the electronics industry
Automatic test equipment - VIP Ultra - Cosmic Equipment S.p.A. - automated / semiconductor / for the electronics industry
Automatic test equipment - VIP Ultra - Cosmic Equipment S.p.A. - automated / semiconductor / for the electronics industry - image - 2
Automatic test equipment - VIP Ultra - Cosmic Equipment S.p.A. - automated / semiconductor / for the electronics industry - image - 3
Automatic test equipment - VIP Ultra - Cosmic Equipment S.p.A. - automated / semiconductor / for the electronics industry - image - 4
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Characteristics

Operating mode
automatic, automated
Test material
semiconductor
Sector
for the electronics industry
Configuration
compact

Description

Overview
The VIP Ultra by Cosmic is a next-generation automatic test equipment (ATE) for high-throughput testing of power semiconductors (Si, SiC, GaN). Designed for cleanroom integration, it scales in parallel from 48 test sites at 80 V / 250 A to 16 sites at 4 kV / 250 A, enabling DC and energy-stress test suites with a compact footprint and optimized total cost of ownership.

Key benefits / Reasons Why
  • Lowest total cost of ownership for power product test flows
  • Ultra-high throughput through extensive parallel testing capabilities
  • Minimal footprint for easy integration with probers and handlers

Product summary
VIP Ultra is a configurable ATE engineered for power-semiconductor testing including discrete devices, power modules and driver ICs. It integrates multi-channel DC sources and sinks, per-channel measurement units, high-count digital IO with per-pin measurement/source (PPMU), LCR meters, highly sensitive picoammeters, TMUs and programmable load circuits to support DC and energy-stress tests across device categories. Announced at APEC 2025 and recognized by industry media.

Configurations
  • VIP Ultra STD 80V
  • VIP Ultra HV 1.7kV
  • VIP Ultra HV 4kV

Technical specifications
  • Number of test sites: STD: 48; HV 1.7kV: 32; HV 4kV: 16
  • Dimensions (D × W × H): 647 mm × 638 mm × 702 mm
  • DCS sources (DCS MP): STD: 48 channels, 80 V @ ±4 A; 1.7kV variant: 32 channels; 4kV variant: 16 channels
  • High Voltage Supply: 80 V @ 250 A (48 sites, STD); 1.7 kV @ 250 A (32 sites); 4 kV @ 250 A (16 sites)
  • Load Programming Module: Up to 48 high-current sink/source up to 250 A @ 80 V + TMU and differential meter circuit (variants: 32 / 16 channels)
  • Digital channels: Up to 320 digital channels (STD / 1.7kV); up to 160 digital channels (4kV)
  • PPMU: Up to 64 PPMU (STD / 1.7kV); up to 16 PPMU (4kV)
  • Floating digital driver: STD up to 48 channels (-5 V to 18 V); 1.7kV up to 32; 4kV up to 16
  • TMU: 48 per-site timing measurement units
  • LCR meters: 48 (STD); 32 (1.7kV); 16 (4kV)
  • Picoammeter: Up to 48 / 32 / 16; current range 2 nA to 2 µA with accuracy down to ±20 pA
  • Measurement accuracy: picoammeter accuracy down to 20 pA; per-channel PPMU capability
  • Inductive & resistive loads: custom board-based solutions
  • Digital IO voltage range: 0–5.5 V (50 mA) with DSIO memory and per-channel PPMU support
  • Parallel performance examples: 48 sites @ 80 V / 250 A and 16 sites @ 4 kV / 250 A
  • Integration: compact form factor for cleanroom integration and compatibility with probers and handlers

Catalogs

VipUltra
VipUltra
2 Pages

Exhibitions

Meet this supplier at the following exhibition(s):

Semicon
Semicon

10-13 Nov 2026 Munich (Germany)

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
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