Performance test system VIP EXTENDED

impedancefor research and developmentfor the aerospace industry

Overview
VIP Extended is a configurable Automatic Test Equipment (ATE) system for parallel testing of silicon, SiC and GaN power devices. Designed for wafer sort, strip test, pick & place and gravity handler environments, it supports up to 48 parallel test sites to maximize throughput and reduce cost per test.

Key features

• Configurable ATE for low-voltage and power devices (driver ICs, IGBT, Power MOSFETs, Power ICs)
• Up to 48 parallel test sites for high units-per-hour (UPH)
• High resource density and modular architecture for flexible production-line integration
• Integrated precision instruments: TMU, picoammeters, LCR meters, PPMUs and high-current sink/source modules

Reasons Why

• Optimized for wafer sort and strip test workflows
• Parallel measurement of Rg, Cg and UIS across up to 48 sites
• Reduced cost of test (COT) through high channel density and modular options

FEATURES — VIP Extended
D×W×H: 640 mm × 600 mm × 350 mm
DCS MP: 48 channels, ±80 V @ ±4 A
High Voltage Supply (std): 80 V / 250 A (48 sites)
Load Prog Module: up to 48 high-current sink/source channels up to 250 A / 80 V + TMU & differential meter circuits
Digital Channels: up to 320 digital channels; up to 64 PPMU
Floating Digital Driver: up to 48 drivers, range -5 V to 18 V
Inductive & Resistive Loads: custom board implementations
LCR Meters: up to 48
Picoammeter: up to 48 picoammeters; current range 2 nA–2 µA, accuracy up to ±20 pA
Timing Measurements: 48-channel TMU
Additional instruments: up to 64 PPMUs, 48 picoammeters, up to 48 LCR meters, inductive/resistive load boards
Cabinet: compact cabinet suitable for production lines (350 × 600 × 640 mm)

Applications

• Wafer sort
• Strip test
• Pick & place integration
• Gravity handler environments
• Markets: automotive, consumer, industrial, aerospace and MEMS

Technical specifications

• Parallel sites: up to 48
• Four-quadrant DC resources: up to 48 units, ±80 V, ±4 A
• High-voltage supply (standard): 80 V / 250 A (48 sites)
• High-current sink/source channels: up to 48 channels, up to 250 A / 80 V
• TMU: 48-channel timing measurement unit
• Digital resources: up to 320 digital channels; 2 M vectors pattern memory
• PPMU: up to 64 programmable parametric measurement units
• Floating digital drivers: up to 48, range -5 V to 18 V
• LCR meters: up to 48
• Picoammeters: up to 48, current range 2 nA–2 µA, accuracy up to ±20 pA
• Inductive & resistive loads: custom board implementations
• Cabinet footprint: 350 × 600 × 640 mm (compact for production integration)