Capacitance tester Quasar200

performancesafetyelectrical safety

Product
ITEM 776-030-00 — Power Characterization Testers

Overview
Wide bandgap (WBG) power devices such as SiC and GaN require dedicated measurement methods due to higher power, faster switching and stricter standards (JESD 24-9, JESD 24-10, AQG-324). The Quasar200 and Pulsar600 provide configured platforms for DC and AC characterization of Si, GaN and SiC devices. Quasar200 targets Si, GaN and lower-power SiC; Pulsar600 targets ultra-high current applications including SiC, inverter and automotive testing.

Key benefits

• Turnkey solution — Complete DC and AC measurement capability with low-inductance test sockets for multiple package types and bare die.
• Measurement integrity — High absolute accuracy and system-to-system reproducibility for credible, repeatable data.
• Operational safety — Enclosed test environment, hardware interlocks and SocketSafe™ protection to mitigate catastrophic DUT failures.

Product presentation
Modular hardware and intuitive software expedite setup, test execution and reporting. Systems include a Linux controller and UKAS-traceable calibration options to support development, research and pre-production labs that require traceable results and audit logs.

Accuracy
High-bandwidth instrumentation and precision timing capture switching transients to the nanosecond range. Built-in auto-calibration and real-time monitoring preserve measurement conditions and support system-to-system consistency.

Safety
Systems provide a fully enclosed test area with monitored interlocks for high-voltage/high-current tests. SocketSafe™ technology rapidly removes energy from the DUT in the event of catastrophic failure, protecting the test socket and measurement hardware. Compliance includes CE marking and SEMI-relevant design practices with UKAS-calibrated references.

Specifications
FEATURES/CONFIGURATIONS | Quasar200 | Pulsar600
AC Source — Voltage | 1,200 V | 1,400 V
AC Source — Current | 1,200 A | 3,000 A
AC Source — Short Circuit Current | 2,000 A | 10,000 A
AC Source — Gate Voltage | -25V to 0V, 0V to 25V | -25V to 0V, 0V to 25V

AC Measure — Voltage Accuracy | 2% of range | 2% of range
AC Measure — Current Accuracy | 1% of range | 1% of range
AC Measure — Voltage Measurement Range | 2,000 V | 2,000 V
AC Measure — Current Measurement Range | 3,000 A included; 1,000 A option | 6,000 A included; 3,000 A and 12,000 A options
AC Measure — Probe Bandwidth | 400 MHz | 120 MHz

Misc. — Gate Resistance | 1 to 255 Ω | 1 to 255 Ω
Misc. — Load Inductor | 100 μH plug-in inductor | 100 μH plug-in inductor
Misc. — DC Link Capacitance | 2–3 mF + 35–40 μF | 2–3 mF + 35–40 μF
Misc. — Parasitic Stray Inductance | <30 nH typical | <30 nH typical

DC Source — Voltage | 3,000 V | 3,000 V
DC Source — Current Drive Range (HV) | 100 nA - 100 mA | 100 nA - 100 mA
DC Source — Current Drive Range (LV) | 100 nA - 1,000 A | 100 nA - 1,000 A
DC Source — Current | 200 A | 600 A
DC Source — Floating Vx range | 25 V, 100 nA – 1 mA | 25 V, 100 nA – 1 mA

DC Measure — Accuracy | 0.10% | 0.10%
DC Measure — Resolution | 16 bit across ±125% of range | 16 bit across ±125% of range
System — Minimum Requirements | Linux controller (included) and ipWORKS v5.51 or later | Linux controller (included) and ipWORKS v5.51 or later
System — Certifications | CE, SEMI S2, S8, ISO 9001 | CE, SEMI S2, S8, ISO 9001

Technical features

• Target devices: Si, GaN, SiC and bare die for WBG characterization.
• Quasar200: optimized for Si, GaN and lower-power SiC testing.
• Pulsar600: designed for ultra-high current applications (SiC, inverter and automotive).
• High-voltage capability: up to 3,000 V DC; AC switching up to 1,400 V depending on model.
• High-current capability: switching and measurement ranges to multi-kA; short-circuit handling to 10,000 A (model dependent).
• Low parasitic design: <30 nH typical on AC test paths.
• Probe bandwidth: up to 400 MHz (Quasar200) and 120 MHz (Pulsar600).
• Measurement accuracy: DC 0.10%; AC voltage 2% of range; AC current 1% of range.
• Resolution: 16-bit acquisition across ±125% of range.
• Gate drive: configurable gate resistance (1–255 Ω) and gate voltage ranges -25V to 0V and 0V to 25V.
• Protection: SocketSafe™ technology, enclosed test area and hardware interlocks.
• Calibration & compliance: UKAS-traceable calibration options; CE marking and SEMI-relevant standards.
• Software: supplied Linux controller; ipWORKS v5.51 or later required.