Semiconductor test platform M2 Flexible Edition

Product Overview
One flexible platform for KGD, packaged devices & small modules. Ultra-fast AC and DC testing up to multiple sites including avalanche, short circuit and DRB stress testing and thermal die-attach package checks. Loadboard-based architecture enables quick switching between different package types and between pick-and-place, gravity feed or leadframe handlers. The platform integrates modular high-voltage, high-current DC and dynamic AC testing in a compact, handler-friendly architecture engineered for 24/7 operation in production environments.

Reasons Why

• Exceptional Flexibility: Rapid setup for new device families, quick handler retooling for different package sizes, easy transitions between ambient and hot test conditions. Suitable for low-volume, high-mix or engineering/NPI scenarios. M2’s modular design allows reconfiguration of tests, topologies, generator combinations and stress conditions with minimal disruption.
• Scalable Platform for Growth: M2 grows with production needs. Add booster boards to increase LV current testing up to 1,000 A. DS5 Quasar and DS6 Pulsar enable dynamic switch testing expansion.
• Reproducible Results: One test architecture across multiple manufacturing stages reduces correlation issues, setup complexity and operator training. One platform for KGD, packaged devices and small modules with production-proven safety.

Key Capabilities

• Modular AC+DC test architecture supporting static parameters, dynamic switch performance, gate quality, avalanche and short-circuit stress tests, DRB stress testing and thermal die-attach checks.
• Loadboard-based approach for fast retooling between package types and handler interfaces (pick-and-place, gravity feed, leadframe strip handlers).
• Engineered for continuous, high-reliability production use with rugged, accurate hardware and minimized maintenance demands.
• Designed for SiC, GaN and silicon power devices at die (KGD), packaged discrete and small module stages.

FEATURES / CONFIGURATIONS (summary table)
FEATURES/CONFIGURATIONS | M2 | M2 PRO | M2 Pulsar | M2 Pulsar Pro | M2 One-Test
Number of test sites | 2 DUT x 2 sites (AC + DC) | 4 DUT x 2 sites (AC + DC) | 2 DUT x 2 sites (AC + DC) | 4 DUT x 2 sites (AC + DC) | 1 site AC + DC combined
AC dynamic switch performance | M2 DS5 Quasar Upto 2kA short circuit | M2 DS5 Quasar Upto 2kA short circuit | M2 DS6 Pulsar Upto 7.5kA short circuit | M2 DS6 Pulsar Upto 7.5kA short circuit | M2 DS5 Quasar Upto 2kA short circuit
DC parametric test | 3kV 200A (integrated) | 3kV 200A (integrated) | 3kV 600A (integrated) Expandable to 1,000A | 3kV 600A (integrated) Expandable to 1,000A | 3kV 200A (integrated)
Gate oxide and quality | Gate resistance & capacitance | Gate resistance & capacitance | Gate resistance & capacitance | Gate resistance & capacitance | Gate resistance & capacitance
UIS avalanche / body diode quality | — | 2kV 1000A AC test | — | 2kV 1000A AC test | —

Additional Notes
M2 is targeted at next-generation wide bandgap (WBG) power products and supports fast reconfiguration, modular expansion (boosters, DS5/DS6 generators), and a production-oriented safety and reliability approach. The system supports handler-friendly integration for pick-and-place, gravity feed and leadframe handlers and is suitable for high-mix/low-volume and high-volume growth scenarios.

Caractéristiques / Spécifications techniques

• Model: M2 Flexible Edition — modular ATE platform for KGD, packaged devices and small modules.
• Supported device technologies: SiC, GaN, silicon power devices (MOSFETs, JFETs, IGBTs, transistors, SCRs, bipolar devices, diodes, TRIACs, intelligent power devices).
• Test types: Static DC parametric tests, dynamic AC switch tests, avalanche, short-circuit, DRB stress testing, thermal die-attach/package checks, gate oxide/resistance/capacitance tests.
• DC parametric (integrated): up to 3 kV; typical integrated currents 200 A (standard) and 600 A on Pulsar variants; expandable to 1,000 A with booster boards.
• AC dynamic switch performance: DS5 Quasar (up to 2 kA short circuit) and DS6 Pulsar (up to 7.5 kA short circuit) options depending on configuration.
• Number of sites (M2 Flexible Edition configuration): 2 DUT x 2 sites (AC + DC); other variants support 4 DUT x 2 sites or single combined site.
• Architecture: Loadboard-based for fast changeover between package types and handler interfaces (pick-and-place, gravity feed, leadframe strip handlers).
• Scalability: Modular generator additions (DS5/DS6), booster boards for increased LV current testing; platform grows with production needs.
• Operation: Rugged, accurate design for 24/7 high-volume production with production-proven safety features.