Optical measurement system C10178-03E

thicknessgaugefor film

The Optical NanoGauge Thickness measurement system C10178 is a non-contact film thickness measurement system utilizing spectral interferometry. Film thickness is measured quickly with high sensitivity and high accuracy through spectral interferometry. Our products use a multichannel spectrometer PMA as detectors, which allows for measurement of quantum yields, reflection, transmission/absorption, and a various other points while simultaneously measuring the thickness of various optical filters and coating films, and more. Features • High speed and high accuracy (Measurement film thickness range (glass):150 nm～50 μm) • Real time measurement • Precise measurement of fluctuating film • Analyze optical constants (n, k) • External control available • Quantum yield, reflectance, transmittance and absorption can be measured with specific accessories Specifications Type number : C10178-03E Measurement models (features) : supports NIR Measurable film thickness range (glass) : 150 nm to 50 μm*1 Measurement reproducibility (glass) : 0.05 nm*2 *3 Measurement accuracy (glass) : ±0.4 %*3 *4 Light source : Halogen light source Measurement wavelength : 900 nm to 1650 nm Spot size : Approx. φ1 mm*3 Working distance : 10 mm*3 Number of measurable layers : Max. 10 layers Analysis : FFT analysis, Fitting analysis, Optical constant analysis Measurement time : 19 ms/point*5 Fiber connector shape : φ12 sleeve shape External control function : RS-232C, PIPE, Ethernet Power supply : AC200 V to AC240 V , 50 Hz/60 Hz Power consumption : Approx. 230 VA