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The Optical NanoGauge Thickness measurement system C12562 is a compact, space-saving, non-contact film thickness measurement system designed to easily ...
HAMAMATSU
The Optical NanoGauge Thickness measurement system C10178 is a non-contact film thickness measurement system utilizing spectral interferometry. Film ...
HAMAMATSU
... NanoGauge Thickness measurement system C11295 is a film thickness measurement system utilizing spectral interferometry. It is designed to measure film thickness as part ...
HAMAMATSU
The Optical NanoGauge Thickness measurement system C10323 is a microscopic thickness measurement systems. Objects with irregular surfaces that would produce high level ...
HAMAMATSU
... important parameter, and researchers have been aware of the importance to control and to evaluate the molecular orientation of OLED devices. The C14234-11 is functional for measuring fluorescence spectrum ...
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... efficiency, measured usually by electroluminescence (EL) method. For this application the external quantum efficiency measurement system C9920-12 is designed. Integrating sphere : 3.3 inch inside diameter, ...
HAMAMATSU
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