Computer-controlled coordinate measuring system APDIS MV4x0

portablefor large partsproduction line

Overview
Nikon's APDIS is a generation of Laser Radar designed for fast, automated, non-contact inspection and absolute measurement across a wide range of industrial and research applications. It measures features at distance without handheld probes, targets or surface preparation, enabling repeatable, automated inspection of complex, delicate or hard-to-reach parts.

Automated Non-Contact Measurement
The system captures detailed measurements at range without physical contact. This removes the need for part preparation, targets or feature adapters and makes APDIS suitable for automating repetitive inspection tasks on shop floors, production lines and in metrology labs.

Key benefits

• High productivity: Fast, automated measurements with minimal setup reduce cycle time and increase throughput.
• Flexible installation: Portable and shop-floor compatible — absolute measurements can be made in situ or on a production line.
• Part and operator protection: Long-range laser measurement maintains a safe distance between instrument, operator and part.
• Minimal preparation: Heterodyne interferometry allows measurement of most surfaces without targets or surface treatment.

Applications

• Automotive — absolute feature measurement for production or metrology rooms without part preparation.
• Aerospace — large-volume automation for shimming, joint inspection and large structural assemblies.
• Energy — automated control and measurement of large structures such as renewable-energy components.
• Space — non-contact inspection of delicate, highly reflective and costly components.

Model comparison (selected rows)
MV430 | MV450 | MV430E | MV450E
Range: 0.5 m to 30 m | 0.5 m to 50 m | 0.5 m to 30 m | 0.5 m to 50 m
Data rate (all models): 4000 Hz
Scanning speed (default settings*): MV430/MV430E – 500 pts/sec (≈2 s/cm2) | MV450/MV450E – 1000 pts/sec (≈1 s/cm2)
Feature measurement: MV430/MV430E – Standard Feature Scan | MV450/MV450E – Enhanced Feature Scan**
Vibration measurement: MV450E – up to 2000 Hz; 1 µm/m sensitivity (not applicable for MV430 series)
Environmental rating (all): IP54

Working limits & orientation
Working limit: 0.5 m – 30 m / 50 m
Azimuth: ±180° | Elevation: ±45°

Accuracy (MPE)
MPE (base): 20 µm + 5 µm/m
Additional angular component: 13.6 µm/m

2-Point length measurement accuracy (summary)
Formula (MPE µm): √(2(20 + 5·RAve)^2 + (13.6·RAve)^2) where RAve = average range in metres.
Examples (Average Range → MPE / Typical): 0.5 m → 33 µm / 17 µm; 1 m → 40 µm / 20 µm; 2 m → 57 µm / 28 µm; 5 m → 115 µm / 58 µm; 10 m → 216 µm / 108 µm; 20 m → 420 µm / 210 µm; 30 m → 625 µm / 313 µm.

Notes
* Default settings — stacking 4, point spacing 0.1 mm, line spacing 1 mm.
** Enhanced Feature Scan can measure features up to twice as fast as the standard variant; exact speed depends on settings.

Technical specifications

• Model: APDIS MV4x0 (MV430, MV450, MV430E, MV450E)
• Range: 0.5 m to 30 m (MV430/MV430E) or 0.5 m to 50 m (MV450/MV450E)
• Data rate: 4000 Hz
• Scanning speed (default): 500 pts/sec (MV430 series) / 1000 pts/sec (MV450 series)
• Feature measurement modes: Standard Feature Scan (MV430) / Enhanced Feature Scan (MV450)
• Vibration measurement: MV450E up to 2000 Hz; 1 µm/m sensitivity
• Working limits: Azimuth ±180°, Elevation ±45°
• Accuracy (MPE): 20 µm + 5 µm/m (base); angular term 13.6 µm/m
• Environmental protection: IP54