Semiconductor inspection system MXI QUADRA™ 7 Pro

X-rayautomatedmeasurement

Quadra™ Pro series creates unbeatable ultra high resolution images. The in-house designed, high performance Dual Mode NT4 X-ray tube and the Onyx detector provide visibility of even the tiniest detail and finding the defects immediately. Nothing can hide anymore. The Quadra™ 7 Pro sets a new standard for 3D/2D manual inspection with a higher resolution for back-end semiconductor applications. Equipped with the revolutionary Onyx® detector technology, it delivers exceptional image clarity and reduced noise levels, elevating the inspection experience to highest levels of accuracy and efficiency. The Quadra 7 Pro is equipped with the latest Dual Mode Quadra NT4® tube, which provides users with maximum flexibility. This innovative feature offers brightness and resolution modes, allowing operators to dynamically switch between them based on their specific application requirements. In addition to its advanced hardware, the Quadra 7 Pro is complemented by the newly developed Revalution™ software. Designed specifically for high-end semiconductor applications, Revalution™ software enhances the user experience with an intuitive interface, optimized workflow, and expanded functionality. It enables operators to efficiently analyze and interpret inspection data, contributing to faster decision-making and improved overall productivity. Key Core Technology Made In UK Quadra™ 7 Pro creates unbeatable ultra high resolution images. The in-house designed, high performance X-ray tube and the detector ensure the visibility of even the tiniest detail and finding the defects immediately. Nothing can hide anymore