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... Thin Film Inspection System*1 has made it possible to perform important inspections, such as film thickness measurement, defect analysis, and composition analysis of various wafers with a single instrument. In ...
... testing in the R&D department, optimization of process control and small series inspection as well as various scientific applications. The dual X-ray tube set-up enables the high-resolution CT system ...
... Test Spec Loop Height Inspection: ±50μm Test Spec Chip Height Inspection: ±10μm Utility AC220V, 3Phase, 60Hz ...
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