Stationary thickness gauge CL-2400 benchtopdigital display
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Characteristics
- Type
- stationary, benchtop
- Technology
- digital display
Description
The CL-2400 is designed for measurements on conductors, such as aluminum discs, and semiconductors, such as silicon wafers. Thickness is measured as the material under measurement passes through the gap formed between two opposing gap sensors. The CL-2400 can be used for static or running thickness measurements. BCD output, RS-232C interface, and remote control inputs are provided for external control, analysis, and measurement automation.
Catalogs
Non-Contact Thickness Meter
10 Pages
Other Onosokki products
Dimensional Measurement
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.