Stationary thickness measuring machine ECV Pro™
filmnon-contactautomatic calibration

stationary thickness measuring machine
stationary thickness measuring machine
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Characteristics

Type
stationary
Applications
film
Technology
non-contact
Calibration
automatic calibration

Description

The ECV Pro system was designed, from the ground up, to eliminate all operator dependent variations in the data. Product Overview The ECV Pro system is the industry standard for measuring active carrier concentration profiles in semiconductor layers. The system’s newly designed digital electronics eliminate drift and significantly improve signal to noise ratio. The unique design of the ECV Pro system eliminates all operator dependent variations in the data. Introducing the first in-situ camera, ECVision, enabling the user to image semiconductor/electrolyte interfaces. It also delivers novel insight of film removal or defect revelation during the etch process. The ECV Pro system software is built on industry standard SEMI E-95 guidelines. This software supports automated profiling and is programmed to generate process control charts.

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.