wafer metrology system
QS1200™

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wafer metrology system wafer metrology system - QS1200™
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Characteristics

  • Type:

    for wafers

Description

The QS1200 FTIR metrology tool is a tabletop system for dopant monitoring, epi thickness measurement, and other applications.

Product Overview

The QS1200 system is specifically designed for advanced semiconductor fabs performing material characterization in silicon growing and device manufacturing areas. It provides a new level of integration of the FTIR technique utilizing proven optical technology, and a manual wafer tray to accommodate SEMI standard wafers of 100, 125, 150, 200, and 300mm diameter. Odd shaped wafer pieces, and 2mm thick silicon slices can also be used on the QS1200 system.