- Metrology - Laboratory
- Metrology and Test Equipment
- Wafer metrology system
- Onto Innovation Inc.
Semiconductor metrology system QS1200™for wafers
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Characteristics
- Type
- for wafers, for semiconductors
Description
The QS1200 FTIR metrology tool is a tabletop system for dopant monitoring, epi thickness measurement, and other applications.
Product Overview
The QS1200 system is specifically designed for advanced semiconductor fabs performing material characterization in silicon growing and device manufacturing areas. It provides a new level of integration of the FTIR technique utilizing proven optical technology, and a manual wafer tray to accommodate SEMI standard wafers of 100, 125, 150, 200, and 300mm diameter. Odd shaped wafer pieces, and 2mm thick silicon slices can also be used on the QS1200 system.
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.