- Metrology - Laboratory
- Metrology and Test Equipment
- Wafer metrology system
- Onto Innovation Inc.
Wafer metrology system QS2200™for semiconductors
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Characteristics
- Type
- for wafers, for semiconductors
Description
Non-destructive wafer analysis
Product Overview
The QS2200 system is a FTIR metrology tool specifically designed for non-destructive wafer analysis. It is used for the characterization and measurement of semiconductor materials as well as device manufacturing.
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