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Wafer metrology system QS2200™for semiconductors
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Characteristics
- Type
- for wafers, for semiconductors
Description
Non-destructive wafer analysis
Product Overview
The QS2200 system is a FTIR metrology tool specifically designed for non-destructive wafer analysis. It is used for the characterization and measurement of semiconductor materials as well as device manufacturing.
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
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