High-current probe card

As automotive technologies such as IGBTs advance, the need for high-current testing—handling several hundred amps through emitter electrodes—is growing rapidly. Traditional probe cards often struggle under these extreme conditions, even when load distribution is optimized across multiple pins. Seiken’s high-current probe card overcomes these barriers by incorporating CNT (Carbon Nanotube) technology at the probe tips, dramatically increasing the allowable current capacity. In addition, the card’s main body is built with a robust metal structure that allows current to flow through the housing as well, minimizing the load on each individual pin. This innovative design enables far more stable and reliable high-current measurements. - High-current capability: Probes are reinforced with CNT technology and a metal housing structure, greatly enhancing current endurance. Compared to traditional wire probes, the shorter terminal length delivers lower inductance, contributing to higher performance. - Superior AC characteristics: By reducing the probe card height to less than half the conventional 30mm, significantly enhanced AC performance and improved measurement stability are achieved. - Fully customizable solutions: Every probe card is custom-designed to integrate with your chip handlers and testers. Flexible manufacturing is available starting from a single unit to full-scale production. Application Examples: - Power Devices (IGBTs, SiC, GaN devices) - Power Semiconductors (High-Voltage MOSFETs, Diodes) Related Products: - High-Current Technology: Seiken’s CNT (carbon nanotube)-plated probes for high-current applications provide low resistance, heat resilience, and more durability, ensuring reliable contact with aluminum electrodes and other demanding test environments. - HC-C IC Sockets: Built with proprietary HC-C (High Current Cube) technology, these sockets offer outstanding current-carrying capacity per terminal and deliver rock-solid electrical performance. Ideal for high-power applications, such as automotive and power devices, they ensure stable and efficient testing under demanding conditions. - Probe Holders (Custom Test Fixtures): Also known as Pin blocks, Probe Holders are essential for precision probing in electronic component testing. Our probe holders ensure perfect alignment and stable contact—whether you're using standard formats or need a fully customized design. Technical Specifications / Features: - Incorporates CNT (Carbon Nanotube) technology at probe tips - Robust metal structure for current flow through housing - High-current endurance (several hundred amps) - Lower inductance due to shorter terminal length - Reduced probe card height for improved AC performance - Custom-designed for integration with chip handlers and testers - Flexible manufacturing from single unit to full-scale production