Non-magnetic probe card

fine pitch

Seiken’s non-magnetic probe cards are engineered from the ground up, backed by years of experience. Every detail—from material selection and precision machining to surface treatment, PCB manufacturing, and assembly—is carefully managed within a fully integrated process. The result is a probe card that delivers consistently stable, high-precision inspections even in the most magnetically sensitive environments. - An optional socket kit further expands functionality, making these probe cards ideal for manual testing of packaged devices. - Ideal for testing components sensitive to magnetic fields—such as electronic compasses—our non-magnetic probe cards provide reliable solutions where uncompromised measurement accuracy is essential. - Flexible probe pin array: With Seiken’s advanced design capabilities, probe arrays can be flexibly configured to match the specific requirements of your device, ensuring optimal performance and precision. - Fine-pitch capability — Precision testing at 150µm pitch: Supports ultra-fine pitches down to 150µm, making it ideal for the high-precision testing of miniaturized electronic components. - Complete one-stop solution: From design through manufacturing and assembly, Seiken provides fully integrated production, delivering the optimal non-magnetic probe card tailored to your testing environment. - Small lot production available: Custom probe cards are available starting from a single unit, offering flexible support for prototypes, development projects, and specialized applications. - Socket kit option for manual testing: Enhance flexibility by adding an optional socket kit, allowing the same non-magnetic environment to be used for efficient manual testing of packaged devices. Application Examples: - Precision inspection of electronic compasses - Characterization of Hall ICs - Magnetic field influence testing for MR and MI sensors - High-precision testing in environments sensitive to magnetic fields Custom solution example: - Non-Magnetic Probe Card for Magnetic Sensor Devices (used by semiconductor manufacturers, front-end and back-end semiconductor processes) Characteristics / Technical Specifications: - Non-magnetic construction for magnetically sensitive environments - Supports probe pin arrays with flexible configuration - Fine-pitch capability down to 150µm - Integrated design, manufacturing, and assembly - Optional socket kit for manual testing - Available for small lot production (from a single unit) - Stable, high-precision inspection