Kelvin probe card

Seiken’s Kelvin probe cards are specifically engineered for four-terminal sensing (Kelvin connection) measurements, delivering highly accurate resistance testing for devices. By independently controlling the current (force circuit) and voltage (sense circuit), Kelvin measurements effectively eliminate the impact of contact resistance—capturing the true device resistance (Rs) with precision. In Kelvin measurements, two terminals must contact a single electrode, such as a solder bump or pad. Seiken’s Kelvin probe cards support fine-pitch measurements starting from electrode pitches as small as 0.35mm. With the ability to reduce the terminal gap to just 0.1mm, stable and reliable contact is achievable even on ultra-small electrodes. (Patent No. 5597108 applies to this design.) Seiken offers complete support for the specialized board required for Kelvin probes. From custom fixture design to full manufacturing services, we provide a one-stop solution—ensuring the perfect pairing between your probe card and testing equipment for maximum accuracy and efficiency. - Reliable contact with small electrodes: Designed for today’s miniaturized technologies, ensuring stable contact even with ultra-small bumps as tiny as φ180μm. - Flexible pin layout for multi-chip testing: Enjoy full design flexibility—our Kelvin probe cards support layouts from 100 to 1000 electrodes per chip and allow for simultaneous multi-chip testing. All of our advanced probe cards have no limitations on pin arrangement, provided the pitch requirements are met. - Easy maintenance with replaceable pins: Maintaining peak performance is simple; our Kelvin probe cards allow for easy pin replacement, minimizing downtime and simplifying maintenance—just like our advanced probe card models. Application Example: - Semiconductor Front-End Testing Related Products: - Kelvin Measurement Technology: Our patented Kelvin probes enable ultra-precise, low-resistance measurements on fine-pitch electrodes. With dual-point contact as close as 0.1mm, they ensure stable connectivity, superior durability, and unmatched accuracy for next-generation devices. - Kelvin IC Sockets: Our Kelvin sockets support precise four-terminal low-resistance testing, even for ultra-compact chips smaller than 1mm. Designed for cutting-edge technologies and high-density ICs, they deliver unmatched accuracy for your most advanced applications. - Probe Holders (Custom Test Fixtures): Also known as Pin blocks, Probe Holders are essential for precision probing in electronic component testing. Our probe holders ensure perfect alignment and stable contact—whether you're using standard formats or need a fully customized design. Technical Specifications / Features: - Four-terminal (Kelvin) measurement capability - Eliminates contact resistance for accurate device resistance measurement - Supports fine-pitch measurements from 0.35mm electrode pitch - Terminal gap can be reduced to 0.1mm for ultra-small electrodes - Patent No. 5597108 - Flexible pin layout: 100–1000 electrodes per chip, multi-chip testing supported - Replaceable pins for easy maintenance - Custom fixture design and manufacturing available