DescriptionThe SP 5000 DI/DS combines a differential interferometer principle with a multi-beam interferometer to deliver simultaneous, highly stable length and interferometric angle (tilt) measurements. This configuration enables detection of ultra-small displacements and minute tilts over extended areas while reducing sensitivity to thermal and environmental disturbances.
Key features- Four-beam laser interferometric displacement-angle differential measuring system
- Stable differential length and pitch (angle) measurements
- Designed for integration on XY stages and plane mirrors
- Beam distances: 15 mm (length measurement) and 6 mm (angle measurement)
- Extremely low temperature sensitivity < 20 nm / K
- OEM and vacuum versions available on request
Application and usageThe interferometer is intended for installation on plane mirrors or as a built-in measurement system; operation with reflectors is possible. Alignment is performed using ultra-stable optical components integrated into the beam path, ensuring repeatable and long-term stable measurements.
Areas of application- Simultaneous measurement of length and angle to compensate Abbe error in precision measuring arrangements
- Position control of X–Y tables using two sensor heads for coordinated measurement
- Long-term stable length and angle measurements with highest resolution
Ideal for- Long-term monitoring and calibration tasks
- OEM integration in precision systems
- Applications with highest stability and resolution requirements
Technical specifications- Measuring range (length): 0 m to ≥ 2 m
- Length resolution: 5 pm
- Length measurement uncertainty: 0.15 µm/m
- Maximum tilt angle (with plane mirror): ±430 µrad
- Angle resolution: 0.02 µrad
- Beam distances: 15 mm (length), 6 mm (angle)
- Temperature sensitivity: < 20 nm / K
- Measuring principle: combination of differential interferometer and multi-beam interferometer for simultaneous length and angle measurement
- Versions: standard, OEM variants and vacuum versions (on request)