Silicon Steel Material Automatic Measuring Device
DX-2012M Silicon Steel Material Automatic Measuring Device is suitable for measuring the incoming inspection of various hot-rolled, cold-rolled oriented, and non oriented silicon steel materials.
It can be configured with standard Epstein square coils to meet the requirements of national standards GB/T3655-2000, GB/T 13789, and IEC 404-2. It can also be used to directly test the AC magnetic properties of soft magnetic material cores in the frequency range of 40Hz~1kHz.
The product complies with the provisions of Chinese national standard GB3657-83, industry standard SJ/T13888-2009, and international standard IEC60404-7. According to the measurement principle of the impact method, the computer control technology is combined with A/D and D/A, and the electronic integrator is used to replace the traditional impact Galvanometer. The analog impact method measurement under the microcomputer control can not only completely eliminate the nontransient error caused by the use of impact Galvanometer in the classical impact method, but also has high measurement accuracy, fast speed, good repeatability, and can eliminate the impact of various human factors, To provide a reliable basis for studying the mechanism of material magnetization process.
Product Features
1. Types of test samples: soft magnetic ferrite, permalloy, amorphous, nanocrystalline, iron powder core, electrical pure iron, and silicon steel sheet.
2. The shape of the test sample: open circuit samples such as bar (rod) shaped, sheet shaped, L-shaped, and U-shaped.
3. Direct measurement is carried out through an open circuit solenoid and measuring equipment: the sample, magnetization coil (N1), and measuring coil (N2) together form a measurement system.
4. By measuring the magnetization current to measure the magnetic field strength, the magnetic field locking accuracy can reach up to 0.1%.
5. The electronic integrator is used to measure the Magnetic flux density, which is different from the existing manual zero clearing and stability adjustment in the market. The zero clearing and stability adjustment of this electronic integrator are fully automatically adjusted by software, and the whole test process does not require manual participation.
6. A solenoid is required for measuring open circuit samples.
7. Test method: Simulated impact method.
8. The basic magnetization curve can be measured by the simulated impact method, which can accurately measure the magnetic characteristic parameter: Coercivity Hc value.
9. Before testing, the measurement system will automatically zero.
10. The software has powerful functions and extremely low technical requirements for testers.