Energy dispersive X-ray fluorescence (EDXRF) spectrometer FISCHER
FISCHERSCOPE XDLM und XDAL

FISCHERSCOPE X-RAY XDLM and XDAL series

The XDLM spectrometers with micro focus tube and proportional counter tube are ideally suited for the inspection of parts where small structures are measured. Typical applications are measurements on pc-boards, plug contacts and electronic components. XDLM spectrometers are equipped with four exchangeable apertures and a programmable XY(Z) measuring stage. This makes them ideally suited for testing mass-produced parts.

The XDAL spectrometers with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentration and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.

The XDAL and XDLM spectrometers have an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things.

Using the FISCHER fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free.

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